NIWeek 2019

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NIWeek 2019
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20-23rd May 2019
NIWeek 2019 Homepage


Keynote Sessions

Tuesday, May 21st, 2019

Wednesday, May 22nd, 2019

Technical Sessions

Software Engineering Processes, Architectures, and Design (SEPAD) Track

Monday, May 20th

Tuesday, May 21st

Wednesday, May 22nd

Thursday, May 23rd

Hardware and Technologies Track

Monday, May 20th

Tuesday, May 21st

Wednesday, May 22nd

Thursday, May 23rd

Software Fundamentals Track

Monday, May 20th

Tuesday, May 21st

Wednesday, May 22nd

Thursday, May 23rd

Academic Track

Tuesday, May 21st

Wednesday, May 22nd

Thursday, May 23rd

Aerospace and Defense Track

Tuesday, May 21st

Wednesday, May 22nd

Thursday, May 23rd

Automotive Track

  • Tuesday, May 21st
    • ADAS/AD Session Series Part 1: Test System Architecture for Massive Data and Sensor Emulation
    Learn from ADAS iiT about a new lidar over-the-air simulation and explore highly flexible fault insertion methods in an environment of virtual test drives. Then hear Konrad's best practices for architecting a lossless DAQ system from all the sensors with advanced data movement and storage techniques.
    • Techniques for Performing High-Bandwidth In-Vehicle Data Logging in Autonomous Vehicles by Jeff Buterbaugh, Ph.D. (slides)
    • One-Stop Test Solution for Autonomous Driving by Frank Heidemann and Michael Konrad
    • Using Driving Scene Data to Meet Automatic Driving Simulation Test Challenges by Zhao Shuai
    • Automotive Track Keynote: Test the Vehicles of Tomorrow by Chad Chesney, Vice President and General Manager of Transportation Business, National Instruments
    Hear from NI about the test implications of the electric vehicle (EV), advanced driver assistance systems (ADAS), and vehicle-to-everything (V2X) communication megatrends. Also discover how NI is helping the automotive industry test the vehicles of tomorrow.
    • ADAS/AD Session Series Part 2: Virtual Test
    Discover from Valeo how to build a reference system for safety-critical systems using virtual test methodology. Then learn from monoDrive how to train and test autonomous vehicle software stacks using high-fidelity sensor and environmental simulation.
    • Virtual Validation ADAS by Paul Borbely (slides)
    • Driving Millions of Virtual Miles Overnight: Testing Autonomous Vehicle Software With Pure Simulation by Celite Milbrandt
  • Wednesday, May 22nd
    • V2X Session Series: Research Testbed and Topics
    Hear customer success stories from S.E.A. that cover V2X (802.11p/DSRC, cV2X/LTE-V) test from RF measurements to communication scenario experiments. Then explore BUPT's V2X testbed that evaluates the performance and feasibility of latency and throughput including mmWave implementation. Lastly, learn about TATA Elxsi's V2X emulation software.
    • Design and Testbed Evaluation of a Converged Sensing and Communication System for Autonomous Vehicles by Qixun Zhang
    • V2X Emulator: A Smart Way to Test V2X by Karthikeyan Padmanaban (slides)
    • Vehicle-to-X Test for Global Standards With the NI Platform by Gerd Schmitz (slides)
    • EV Session Series Part 1: Battery Validation
    Examine new NI power electronics offerings for test systems like battery pack cyclers, vehicle simulation for inverter testing, and dynamometers for electric motors. Then hear from Austin Consultants about a modular test approach in test cell applications based on real-world examples.
    • Battery Validation Test by Ty Prather and Todd Walter (slides)
    • A Platform-Oriented Approach to Electric Vehicle Test by Ty Prather and Chris Garratt
    • EV Session Series Part 2: Embedded Software Test
    Opal-RT and NI discuss the tools and solutions for testing and validating the intelligent subsystems and controllers of the electric powertrain. JSOL then explores how to leverage 2D/3D electromagnetic field finite element analysis (FEA) models to achieve a highly accurate plant model in the context of the model-based design approach.
    • Emulating EV Powertrains for HIL and System Integration by Ben Black
    • Creating a High-Fidelity E-Motor Model for XiLS Using JMAG-RT by David Farnia (slides)
  • Thursday, May 23rd
    • Hardware-in-the-Loop Test Session Series: SLSC and MathWorks Tools
    Learn from Aliaro AB and NI how to architect switch, load, and signal conditioning (SLSC) structures for further flexibility and examine the hardware-in-the-loop (HIL) reference architecture. Then hear about NI's latest efforts to integrate MathWorks models with NI software and hardware for HIL and rapid control prototyping (RCP) applications by reviewing The MathWorks, Inc. Simulink® and SimscapeTM examples
    • Flexible HIL Design Using NI SLSC by Mikael Bedemo and Roger Johansson
    • HIL and RCP Using MathWorks and NI Tools by Paul Barnard and Jeannie Falcon
    • Automotive Communication Bus Session Series: AUTOSAR and Automotive Ethernet
    Explore a new automotive Ethernet offering from NI and learn how AKKA and NI create restbus simulations according to AUTOSAR requirements for devices under test with CAN/CAN-FD, LIN, FlexRay, and automotive Ethernet bus communication. Then hear about measX's case study at some major automotive OEMs.
    • Introducing the New Automotive Ethernet Interface by Aimee Xia
    • AUTOSAR Restbus Simulation by Martin Widder and Andreas Stark (slides)
    • AUTOSAR 4.3: Using LabVIEW for a Multiplatform Car Communication Network Framework by Thomas Irmen
    • Best Practices for Data Management and Production Test
      • How Companies Save Millions by Managing Sensor Data by Barry Hutt (slides)
      • 2 Ways to Make the Most Out of Your Production Test Systems by Arturo Vargas and Salman Gopalani (slides)

Semiconductor Track

  • Tuesday, May 21st
    • Improving the Semiconductor Design to Test Workflow by George Zafiropoulos, VP Solutions Marketing, National Instruments
    NI is partnering with semiconductor design tools technology leaders to improve the overall flow from product concept to production. Learn from NI and Cadence Design Systems about semiconductor data management and analysis tools. Also discover the benefits of building linkages between pre- silicon design verification and test platforms.
    • ON Semiconductor Takes a New Approach to Production Test by Warren Latter, Staff Test Engineer, On Semi (slides)
    Explore ON Semiconductor's new approach to semiconductor production test at both the pakage and wafer levels. Learn how ON, by partnering with NI, was able to meet extremely demanding deadlines and implement a standardized test platform across their global organization while reducing operational and capital expenditures.
  • Wednesday, May 22nd
    • Semiconductor Wafer Probe Test Solutions for mmWave Production by Tim Cleary, Sr. Director of Marketing, FormFactor (slides)
    Semiconductor wafer probe test requires several elements to be successful. Explore these requirements for the increasing number of RF and mmWave device test applications today. Learn about performance requirement trade- offs for cost-effective production, probe card design, direct dock interfacing, calibration, and other setup considerations.
    • Challenges and Solutions for mmWave OTA Test by Alejandro Buritica, Senior Product Marketing Manager, National Instruments (slides)
    The 5G industry is seeing more semiconductor devices that operate above 24 GHz, many of which are integrated antenna-in-package (AiP) units that require over-the-air (OTA) test. Learn about the characteristics and challenges of OTA test and the current solutions for fast OTA characterization and manufacturing test.
    • Key Considerations When Selecting Contactors for 5G and mmWave Semiconductor Devices by John Chung, Manager, Johnstech (slides)
    Learn how contactor performance can affect your semiconductor device under test. Examine impedance, return loss, and capacitance versus frequency to test various sockets used for MMICs. Also discuss contractor performance over the lifetime of your semiconductor and ways to maximize the life of your contactor and reduce your test cost.
  • Thursday, May 23rd
    • Implementing the Latest DPD Models From Theory to Reality by Andy Fenley, Senior Test Engineer, Qorvo (slides)
    Chipmakers who build higher power RF power amplifiers often operate in the nonlinear region. However, if the nonlinearity is understood, engineers can predistort the signal to get a linear output. Though great in theory, this is often difficult in practice. This session bridges the two with a real-world example.
    • How to Succeed (and Fail) at Bridging Validation and Production Test by John Bongaarts, Offering Manager - Semiconductor, National Instruments (slides)
    The ability to meet time-to-market targets is key for a chipmaker to be competitive. Many have attempted to condense schedules and improve execution while maintaining quality by looking for gains across first silicon bring-up, characterization, and production test. Explore the successes and failures in these attempts and address their common traits.
    • 400 G Transceiver Test: High-Volume Manufacturing-Ready Solutions by Bill Driver, Senior Product Manager, National Instruments; Ignazio Piacentini, Engineer, Ficontec; Kees Propstra, Sr Director of Product Marketing, multiLane Inc; and Andy Stevens, CEO, Coherent Solutions Ltd (slides)

Diversity Sessions

  • Tuesday, May 21st
    • Diverse Voices Furthering Innovation Panel
    Panel includes: Carla Piñeyro Sublett, CMO, NI (Moderator); Anita Dodia, Vice President of Engineering, Vrbo; Duy-Loan Le, Board Member, NI; Fabiola De la Cueva, Leader at Delacor, LabVIEW Champion; Dr. Donald Bossi, President, FIRST; and Kirya Francis, VP of Diversity & Inclusion, GSD&M
    Join us for a panel discussing the benefits of promoting diversity within the technology industry, and challenges that are often faced when working towards that goal. Our panelists will speak from personal experience on everything from working to diversify the pipeline of students in technology, to working as a minority within the industry, to benefits realized by prioritizing diversity and inclusion within a technology company.
    • Unlocking the Competitive Advantage of a Multigenerational Workplace by Ashlee J. Davis, Cargill
    For the first time in modern history, the American workforce comprises five generations working side by side. Statistics show that this newly recognized multigenerational workforce has caused organizational behavior changes and unprecedented levels of workplace tension. To successfully manage and motivate a workforce that can easily range in age from 18 to 80, organizations, and the leaders and teams within them, need to understand the culture, principles, and other factors that create a welcoming workplace for generations to achieve their goals both individually and collectively. At this session, explore recently released research data, common multigenerational workplace problems, and the tools you need to realize the ultimate competitive advantage that a multigenerational workplace offers.
    • Empowering Employees to be their Authentic Selves at Work by Deirdre Walsh, Silicon Labs
    Despite workplaces focusing on diversify and inclusion, many individuals feel the need to downplay or disassociate part of their identity to avoid potential bias, which is known as covering. In fact, 75 percent of individuals feel the need to cover in the workplace, which can have serious repercussions on an organization's innovation and productivity. Join Deirdre Walsh, the director of Marketing and Communications at Silicon Labs, as she discusses the importance of helping employees be their authentic selves at work.
  • Wednesday, May 22nd
    • The Why and How of Inclusive Teams by Stefanie Breyer, NI
    Join Stefanie Breyer, NI's vice president of product planning, as she discusses how diverse and inclusive teams deliver increased performance and foster innovation. Drawing on her extensive experience building effective and high-performing teams in R&D, Stefanie discusses the benefits and challenges of having a diverse team and shares some best practices for building strong, collaborative teams in which everyone has a sense of purpose and belonging.
    • Bias Busting Throughout the Workplace by Ana Dison and Enrique Dominguez
    To create an inclusive environment where differences are respected and valued, it is important to explore our own mindsets, behaviors, and biases. In this interactive session, explore unconscious bias, how to counter it, and how to create and support a diverse and inclusive culture where all people are empowered to contribute fully.

Extras

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