NIWeek 2019/Advances in Ethernet to Test Connected Electronic Devices

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Advances in Ethernet to Test Connected Electronic Devices
Conference NIWeek 2019
Presenters Matthew Griffin
Aimee Xia
Advances in Ethernet to Test Connected Electronic Devices by Matthew Griffin and Aimee Xia
Industrial and automotive developments in areas like autonomous vehicles and machine control have produced incredible growth in the number of features and overall complexity of electronic devices. These applications are driving needs for increased bandwidth and deterministic communication that are approaching the limits of traditional networks. Learn how IEEE 802.1 standards and open specifications can help meet these challenges. Discover the role of Ethernet in future electronics architectures and the advantages of using common standards for interoperability with existing protocols.


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