NIWeek 2019/DC Measurement Best Practices: Optimizing for Parasitics, Noise, and Drift
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| Conference | NIWeek 2019 |
| Presenters | Kevin Cawley Eric Hartner Blake Lindell Quentin Smith |
DC Measurement Best Practices: Optimizing for Parasitics, Noise, and Drift by Kevin Cawley, Eric Hartner, Blake Lindell, and Quentin Smith
MM, SMU, power supply, and nanovoltmeter instrumentation is found in nearly every automated test or automated measurement system. At this session, examine concepts such as parasitic effects, noise, and drift.