NIWeek 2019/Semiconductor Wafer Probe Test Solutions for mmWave Production
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| Conference | NIWeek 2019 |
| Presenters | Tim Cleary |
Semiconductor Wafer Probe Test Solutions for mmWave Production by Tim Cleary
Semiconductor wafer probe test requires several elements to be successful. Explore these requirements for the increasing number of RF and mmWave device test applications today. Learn about performance requirement trade- offs for cost-effective production, probe card design, direct dock interfacing, calibration, and other setup considerations.