LabVIEW VI Analyzer Toolkit 2009

LabVIEW VI Analyzer Toolkit ↑

LabVIEW VI Analyzer Toolkit 2010 →

Release date: August 4, 2009

Tests

Tests included with LabVIEW VI Analyzer Toolkit 2009 by category:

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• LabVIEW VI Analyzer Toolkit
  • Block Diagram
    • Performance
      • Arrays and Strings in Loops
      • Coercion Dots
      • Enabled Debugging
      • Wait in While Loop
      • Wired Terminals in Subdiagrams
    • Style
      • Backwards Wires
      • Control Terminal Label Visible
      • Control Terminal Wiring
      • Node Density
      • Sequence Structure Usage
      • String Constant Style
      • Unused Code
      • Wire Bends
      • Wire Crossings
      • Wires Under Objects
    • Warnings
      • Adding Array Size Elements
      • Breakpoint Detection
      • Bundling Duplicate Names
      • Error Cluster Wired
      • For Loop Iteration Count
      • Globals and Locals
      • Hidden Objects in Structures
      • Hidden Tunnels
      • Indexer Datatype
      • Pattern Label
      • Reentrant VI Issues
      • Typedef Cluster Constants
  • Complexity Metrics
    • Cyclomatic Complexity
    • Depth of Nesting of Structures
    • Fan In
    • Fan Out
    • Modularity Index
  • Documentation
    • Developer
      • Comment Usage
      • Label Call Library Nodes
      • Revision History
    • User
      • Spell Check
      • VI Documentation
  • Front Panel
    • SubVI
      • Array Default Values
      • Cluster Sized to Fit
      • Control Alignment
    • User Interface
      • Clipped Text
      • Dialog Controls
      • Duplicate Control Labels
      • Empty List Items
      • Font Usage
      • Overlapping Controls
      • Panel Size and Position
      • Transparent Labels
  • General
    • File Properties
      • SubVI and TypeDef Locations
      • VI Extension
      • VI Name
      • VI Saved Version
      • VI Size
    • Icon and Connector Pane
      • Connected Pane Terminals
      • Connector Pane Alignment
      • Connector Pane Pattern
      • Default Icon
      • Error Style
      • Icon Size and Border
      • Polymorphic Terminals
      • Terminal Connection Type
      • Terminal Positions
    • VI Properties
      • Broken VI
      • Built Application Compatibility
      • Driver Usage
      • Platform Portability
      • Removed Diagram
      • Toolkit Usage
      • VI Lock State
  • VI Metrics
    • Connector Inputs and Outputs
    • Controls and Indicators
    • Diagram Count
    • Diagram Size
    • Node Count
    • Property Reads and Writes
    • Shared Library Calls
    • Structure Count
    • Wire Sources