NIWeek 2019

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Keynote Sessions

Tuesday Morning Keynote: Full Force Ahead (Tuesday, May 21^st, 2019)

Links Coming Soon

Tuesday Afternoon Keynote: The Full Force of the NI Platform (Tuesday, May 21^st, 2019)

Links Coming Soon

Wednesday Morning Keynote: Full Force Ahead Toward Disruptive Change (Wednesday, May 22^nd, 2019)

Links Coming Soon

Wednesday Afternoon Keynote: An Enduring Force-Defying Boundaries (Wednesday, May 22^nd, 2019)

Links Coming Soon

Technical Sessions

Software Engineering Processes, Architectures, and Design (SEPAD) Track

• Monday, May 20^th
  • How to Be Ultra Productive With OOP in LabVIEW NXG Using UML by Jeffrey Habets, Founder/CEO, VI Technologies (Links Coming Soon)
  • I Find Your Lack of LabVIEW Programming Speed Disturbing by Darren Nattinger, Principal Engineer, National Instruments (Links Coming Soon)
  • The Importance of Abstraction and Standardization in Automated Test by Jonathan Hobson, Systems Engineering Group Lead, TBG Solutions (Links Coming Soon)
  • These Innovative Tricks for #ProjectRequirements Will Change Your Life by Quentin Alldredge, Software Engineer, Q Software Innovations; Chris Beuschel, Senior Systems Engineer, Konrad Technologies; and Becky Linton, Senior Systems Engineer, Konrad Technologies (Links Coming Soon)
  • Get Team Buy-In: Running Process Improvement Workshops by Peter Horn, AES, National Instruments (Links Coming Soon)
  • Malleable VIs: More Flexible Code by Stephen Loftus-Mercer, Principal Software Architect, National Instruments (Links Coming Soon)
  • No NI Summit in Your City? Build Your Own! by Darren Mather, LabVIEW Architect, iNU Solutions (Links Coming Soon)
  • TestStand Customization: Architecting TestStand Framework for Noncoders by Sreejith Sreenivasan, Systems Architect, Multics Ltd (Links Coming Soon)
  • Traits: A New Approach to Designing Reusable Code by Dmitry Sagatelyan, CEO, Arktur Technologies LLC (Links Coming Soon)
  • Customizing Your WebVIs by Darin Gillis, R&D Product Owner - LabVIEW NXG Web Module, National Instruments and Milan Raj, Senior Software Engineer, National Instruments (Links Coming Soon)
  • Decoupling LabVIEW Object-Oriented Programming Classes via Abstraction by John Lokanis, Architect, F5 Networks (Links Coming Soon)
  • Designing Software Like LEGO® Sets by Stephen Moore, Systems Engineer, Moore Good Ideas (Links Coming Soon)
  • Using and Abusing Channel Wires: An Exercise in Flexibility by Robert Schor, Scientist, NIH (Links Coming Soon)
  • Using DQMH in TestStand by Sam Roundy, Partner, Testeract (Links Coming Soon)

• Tuesday, May 21^st
  • Automating Repetitive Development Tasks in TestStand by Chris Fazekas, Test Engineer, Lockheed Martin (Links Coming Soon)
  • Creating Powerful Web Apps With the LabVIEW NXG Web Module by Matthias Baudot, Software Architect, STUDIO BODs (Links Coming Soon)
  • Lean LabVIEW by Steve Watts, Designer, SSDC Ltd (Links Coming Soon)
  • Who Are You Developing Your HAL/MAL For? You Or The Test Engineer by Grant Gothing, Chief Technology Officer, Bloomy (Links Coming Soon)
  • Designing Advanced LabVIEW-Based HALs and Frameworks for Mindful Extension by Ryan Friedman, Principal Software Architect, National Instruments and Phil Joffrain, Chief Software Engineer, National Instruments (Links Coming Soon)
  • Effectively Using Packed Project Libraries by Mark Yedinak, Advanced Engineer, Zebra Technologies Corporation and Yinhui Chen, Software Test Engineer, Zebra Technologies (Links Coming Soon)
  • Efficient User Interface Development in Post-Silicon Validation by Wolfgang Rominger, Verification & Validation Engineer, NXP Semiconductor Austria and Denis Grgic, Student, FH Joanneum (Links Coming Soon)
  • From Variant Attributes to Sets and Maps (New in 2019) by Christian Altenbach, Research Ophthalmologist, UCLA (Links Coming Soon)
  • Good Component Design for LabVIEW NXG by Taylor Riche, Principal Product Owner, National Instruments (Links Coming Soon)
  • Code Trafficking: Smuggling Your Best Software by Christian Butcher, Technician, Okinawa Institute of Science and Technology; Tim McClung, Systems Engineer, Fike; and Sam Roundy, Partner, Testeract (Links Coming Soon)
  • If It Bleeds We Can Kill It: Ninja Skills for Test Time Reduction by Norman Kirchner, Principal RF & Communications Applications Engineer, National Instruments (Links Coming Soon)
  • Simplifying your HAL with LVOOP and DQMH® by Fabiola De la Cueva, Certified LabVIEW Architect, Founder, Delacor and Michael Howard, Principal Automation Test Engineer, Advanced Bionics (Links Coming Soon)
  • VeriStand Custom Device Design for Usability and Maintainability by Tristan Cowan, Chief Engineer, Real-Time Test, Bloomy Controls (Links Coming Soon)
  • VI Analyzer: The Unsung Hero of Software Quality Control by Chris Roebuck, LabVIEW Architect, Konrad Technologies (Links Coming Soon)
• Wednesday, May 22^nd
  • 10 Steps to Unleash Engineering Productivity With Automated Evaluation by Josef Eiswirt, Sales Manager, measX GmbH & Co. (Links Coming Soon)
  • LabVIEW NXG: Advisory Lightning Rounds by Sumedha Ganjoo, Project Manager, National Instruments; Nicole Richard, National Instruments; Taylor Riche, Principal Product Owner, National Instruments; and Jon Soneson, Group Manager, Software User Experience, National Instruments (Links Coming Soon)
  • LabVIEW Unit Testing: Outlook & Tutorial by Peter Bokor, Dr, IncQuery Labs and Barnabs Reischl, Engineer, IncQuery Labs Ltd. (Links Coming Soon)
  • Sharing LabVIEW Code: What Tools Are Good For What? by Andrew Heim, Staff Systems Engineer, Endigit and Tanner Blair, Systems Engineer - Embedded, National Instruments (Links Coming Soon)
  • Automating Test Procedure to Test Sequence With the TestStand API by James Besancon, Project Engineer, Bloomy Controls (Links Coming Soon)
  • By-Reference Architectures for More Flexible Software Design by Derrick Bommarito, LabVIEW System Architect, Contractor and Shawn Walpole, Senior Systems Engineer, Endigit (Links Coming Soon)
  • LabVIEW Reuse and Package Management by Brian Hoover, Test Software Architect, Samsung (Links Coming Soon)
  • Software Engineering in LabVIEW: A Look at Tools and Processes by Paul Morris, Dr, Precision Acoustics Ltd and Cesar Teixeira, Chief Executive Officer, Blue Eyes Systems (Links Coming Soon)
  • Achieve Success With an Intermodular Communications Framework by Carlton Heard, Software Architect, Johnson Controls and Rob Humfeld, Chief Software Architect, JET Engineering (Links Coming Soon)
  • Best Practices for Building and Distributing Componentized LabVIEW Applications (Links Coming Soon)
  • Introducing JIVE: JIRA Integration for LabVIEW by Chris Roebuck, LabVIEW Architect, Konrad Technologies (Links Coming Soon)
  • Mapping Product Requirements to Test System Requirements and Creating Test Limits by Jomar Ochoco, Principal Test System Engineer, Abbott Laboratories (Links Coming Soon)
• Thursday, May 23^rd
  • Continuous Integration Using GitLab and VMware: Dynamically Launching and Assigning Virtual Machines by Samuel Taggart, Owner, System Automation Solutions LLC (Links Coming Soon)
  • Design Patterns for Decoupled UIs in LabVIEW: Theory and Practice (Links Coming Soon)
  • SystemLink™ Software: Deriving Automated Test Insights by Matthew Friedman, Principal Product Marketing Manager, National Instruments; Joshua Prewitt, Section Manager, National Instruments; and Matthew Vaterlaus, Senior Group Manager, National Instruments (Links Coming Soon)
  • Achieve Better UIs With a Dynamic Sizing Library and Object-Oriented UI Panels by Derrick Bommarito, LabVIEW System Architect, Contractor and Wiebe Walstra, Ing., Carya (Links Coming Soon)
  • Automating App Distribution and Installation Using SystemLink™ Server and NI Package Manager by Steven Dusing, Project Engineer, DMC Inc. and Beth Reinert, Systems Engineer, DMC Inc. (Links Coming Soon)
  • Everything a Software Engineer Needs to Know Outside Software Engineering by Chris Cilino, LabVIEW Framework Architect, Cirrus Logic (Links Coming Soon)
  • Message Exchange Patterns and Tools for Distributed Systems by Francois Normandin, LabVIEW System Architect, National Research Council Canada and Sarah Zalusky, Senior Project Engineer, JKI (Links Coming Soon)
  • Stop Breaking the Trunk! A Step-by-Step CI Tutorial for Test Programs by Jonathan Newkirk, Senior Hardware Test Engineer, Impinj Inc and Chris Roebuck, LabVIEW Architect, Konrad Technologies (Links Coming Soon)
  • An Effective Test Strategy is More Than a Killer HAL/MAL (Links Coming Soon)
  • Better, Faster, Stronger: It's Not All Technical by Andy Fenley, Senior Test Engineer, Qorvo; Chris Roebuck, LabVIEW Architect, Konrad Technologies; and Will Schoettler, Managing Director, Choose Movement Consulting LLC (Links Coming Soon)
  • Case Study: Software Standardization in Large Teams by Kabul Maharjan, Renishaw PLC (Links Coming Soon)
  • On Refactoring: Real-World Approaches for Improving Code by Christopher Field, President, Principal Developer, Field R&D Services; Cesar Teixeira, Chief Executive Officer, Blue Eyes Systems; and Oliver Wachno, Dipl.-Ing.(FH), Ingenieurbro Oliver Wachno (Links Coming Soon)
  • Prof Watts' Theory on Why Programming in LabVIEW is Fun! by Steve Watts, Designer, SSDC Ltd (Links Coming Soon)

Hardware and Technologies Track

• Monday, May 20^th
  • Behind the Design: Turning Large Scale Metal Additive Technology into Smart Manufacturing by William Carter, Technical Professional, Oak Ridge National Laboratory (ORNL); Christopher Masuo, Post-Bachelor Research Associate, ORNL; and Dr. Andrzej Nycz, ORNL
  • Developing an ATE Standardization Roadmap With PXI at the Core by Jerry Hopp, Business Development Manager, Virginia Panel Corporation and Quentin Smith, Product Manager, NI
  • Tips and Tricks for Using TSN With NI Hardware by Austin Elledge, Product Support Engineer, National Instruments and Erik Hons, Chief Software Engineer, National Instruments
  • Accuracy I: Understanding Data Acquisition System Accuracy by David Funkhouser, Senior Group Manager, National Instruments
  • How to Optimize Signal Integrity: Oscilloscopes by Jesse Ormston, Principal Hardware Engineer, NI and Mark Whittington, Chief Architect, National Instruments
  • DC Measurement Best Practices: Optimizing for Parasitics, Noise, and Drift by Kevin Cawley, Chief Engineer, NI; Eric Hartner, Engineer, NI; Blake Lindell, Engineer, NI; and Quentin Smith, Product Manager, NI
  • ITA Design Considerations by Sean Casey, Test System Engineering Manager, Circuit Check Inc.
• Tuesday, May 21^st
  • Building Smarter Rack-Based Test Systems by Austin Hill, Product Planner, National Instruments
  • C Series and DAQ Product Roadmap by Sam Burhans, Product Manager, National Instruments
  • How to Design a Multi-FPGA System by Cheryl Texin, Systems R&D Engineer, National Instruments and Brad Sherman, Staff Applications Engineer, National Instruments
  • FPGA Image Processing: When, Why, How? by Christophe Caltagirone, Principal Software Engineer, National Instruments
  • Introducing NIs First Wireless Sensor by Madison Terzo, Product Manager, National Instruments
  • PTP for Data Synchronization: Time-Critical Acquisition Across Multiple Devices by Ashley Enderlin, Project Engineer, DMC Inc and Tom Nilsson, Systems Engineer, DMC
• Wednesday, May 22^nd
  • Prototyping With CompactRIO and HIL Testing With PXI for the Race Track by Marco Schmid, Owner/Lead, Schmid Elektronik
  • Streamline Your LabVIEW Real-Time Development by Taylor Donahue, Project Engineer, Bloomy Controls
  • What's New in the NI PXI Platform by Austin Hill, Product Planner, National Instruments
  • Accuracy II: SAR Versus Delta-Sigma ADCs by Albert Block, Staff Analog Engineer, National Instruments
  • Hack Your Car With NI CAN Interfaces and LabVIEW by James Fan, Product Manager, Automotive Networks, National Instruments
  • Designing for High-Throughput Data Movement on the PXI Platform by Rick Clark, Product Manager - Automated Test, National Instruments
  • Dodging Distributed DAQ Disaster: 5 Do's and Don'ts by Derek Burrows, Product Marketing Engineer, National Instruments
• Thursday, May 23^rd
  • Accuracy III: Advanced Techniques for Removing Noise by Michael Denton, Senior Product Manager, National Instruments
  • Advances in Ethernet to Test Connected Electronic Devices by Matthew Griffin, Product Manager, National Instruments and Aimee Xia, Product Marketing Manager, National Instruments
  • Getting the most out of the New CompactRIO and sbRIO Controllers with NI-DAQmx and TSN by Tucker Davis, Product Manager - Platform & Precision I/O, National Instruments
  • A Deep Dive on Synchronization in PXI by Brad Sherman, Staff Applications Engineer, National Instruments
  • Linux and NI: How This Combination Benefits You by Michael Denton, Senior Product Manager, National Instruments
  • Using CompactRIO With NI-DAQmx in the Real World by Rhys Bowley, Platform Lead - DAQ and RIO, National Instruments
  • Condition Based Maintenance in the IIoT by Preston Johnson, Principal, Allied Reliability Group
  • Securing Your cRIO Deployment by Haris Okanovic, Principal Software Engineer, National Instruments
  • Using Machine Learning and Deep Learning in NI Vision by Nicolas Vazquez, National Instruments

Software Fundamentals Track

• Tuesday, May 21^st
• Wednesday, May 22^nd
• Thursday, May 23^rd

Academic Track

• Tuesday, May 21^st
  • Microwave Lab Course at the University of Colorado Boulder by Taylor Barton, Professor, University of Colorado Boulder
  • Rock On! Using Record Players and LabVIEW to Teach PID Control by Eric Stach, Research and Development Engineer, Duke University
  • Keynote: Endeavor to Transform Traditional Engineering Education by Brad Rowland, ENDEAVOR, Oklahoma State University and Travis Escoffery, Mechatronics Product Marketing, National Instruments
• Wednesday, May 22^nd
  • The Reconfigurable Radio Network Platform by Torbjrn Ekman, Professor, Norwegian University of Science and Technology
  • From Research to Industry: High-Speed Synchrophasors for Smart Grids by Paolo Romano, CEO, Zaphiro Technologies
  • Save Onboarding Costs Through an Industry-University Partnership by Wolfgang Rominger, Verification & Validation Engineer, NXP Semiconductor Austria and Thomas Messner, Lecturer, Researcher, FH JOANNEUM
  • LabVIEW-Based Internal Combustion Engine Control Using CompactRIO by Matt Hall, Professor, UT
  • Remote Labs for the Development of Engineering Skills by Manuel E. Macias, Dr., Tecnologico de Monterrey
• Thursday, May 23^rd
  • Multi-User MIMO Sounding Platform for High-Dynamic V2X Channels by Daniel Stanko, Fraunhofer Institute for Integrated Circuits IIS and Carsten Andrich, M.Sc., Fraunhofer Institute for Integrated Circuits IIS
  • How NI Technology supports Remote Labs in Engineering Education by Thomas Klinger, Professor, Carinthia University of Applied Sciences
  • Developing an Energy Manager for Microgrids Based on LabVIEW by Anton Petrochenkov, Head of Microprocessor Automation Units Depatment, Perm National Research Polytechnic University and Ilya Kiselev, Head of Education Projects, STEM INSTRUMENTS
  • USRP-Based Vehicular Visible Light Communications (V-VLC) by Bugra Turan, PhD Researcher, Koc University
  • Iteration on Student Projects: Beating Humans at Foosball by Christophe Salzmann, Lecturer, Research Associate, Ecole polytechnique federale de Lausanne (EPFL)
  • The Internet of Production Cluster of Excellence by Matthias Brockmann, Dr.-Ing., RWTH Aachen

Aerospace and Defense Track

• Tuesday, May 21^st
  • The Big Daddy of Big Data: A Whirlwind of Data in Wind Tunnels by Darren Schmidt, Chief Technology Officer, Viviota
  • Aerospace and Defense Keynote: Key Trends Driving the Industry by Luke Schreier, Director of Automated Test Product Marketing in Test Systems, NI
  • Building a Real-Time Radar Target Simulator With PXI and LabVIEW in 3 Months by Satya Gopal, Constelli; Avinash Chenreddy, Constelli; and Ravi Teja, Constelli
• Wednesday, May 22^nd
  • Designing and Deploying SIGINT and Electronic Warfare Systems by Lars Hedlund, Sales Manager, Novator Solutions and Henrik Ulfhielm, CEO, Novator Solutions AB
  • The Ups and Downs of Moving a VNA From the Frequency Domain to the Time Domain by Tom Sanders, Sr. Systems Engineering Manager, Hiller Measurements and Abhay Samant, Vice President of Engineering, Hiller Measurements
  • VPX Technology Update and Test Challenges by Ben Robinson, Aerospace, Defense, and Government Solutions Marketer, National Instruments
• Thursday, May 23^rd
  • Focus on the Mission With Open-Source Test Architectures by Chris Bakker, CEO, SET Americas
  • Rebuilding an Iron Bird With PXI and SLSC by Andrew Heim, Staff Systems Engineer, Endigit and Shawn Walpole, Senior Systems Engineer, Endigit
  • An Effective Test Strategy is More Than a Killer HAL/MAL
  • Benefits of Model-Based Control and Real-Sim Switching in Electromechanical Test Rigs by Matthew Eurich, President, Wineman Technology Inc. and Todd VanGilder, VP of Sales, Wineman Technology

Automotive Track

• Tuesday, May 21^st
  • ADAS/AD Session Series Part 1: Test System Architecture for Massive Data and Sensor Emulation
    • Techniques for Performing High-Bandwidth In-Vehicle Data Logging in Autonomous Vehicles by Jeff Buterbaugh, Ph.D.
    • One-Stop Test Solution for Autonomous Driving by Frank Heidemann and Michael Konrad
    • Using Driving Scene Data to Meet Automatic Driving Simulation Test Challenges by Zhao Shuai
  • Automotive Track Keynote: Test the Vehicles of Tomorrow by Chad Chesney, Vice President and General Manager of Transportation Business, National Instruments
  • ADAS/AD Session Series Part 2: Virtual Test
    • Virtual Validation ADAS by Paul Borbely
    • Driving Millions of Virtual Miles Overnight: Testing Autonomous Vehicle Software With Pure Simulation by Celite Milbrandt
• Wednesday, May 22^nd
  • V2X Session Series: Research Testbed and Topics
    • Design and Testbed Evaluation of a Converged Sensing and Communication System for Autonomous Vehicles by Qixun Zhang
    • V2X Emulator: A Smart Way to Test V2X by Karthikeyan Padmanaban
    • Vehicle-to-X Test for Global Standards With the NI Platform by Gerd Schmitz
  • EV Session Series Part 1: Battery Validation
    • Battery Validation Test by Ty Prather and Todd Walter
    • A Platform-Oriented Approach to Electric Vehicle Test by Ty Prather and Chris Garratt
  • EV Session Series Part 2: Embedded Software Test
    • Emulating EV Powertrains for HIL and System Integration by Ben Black
    • Creating a High-Fidelity E-Motor Model for XiLS Using JMAG-RT by David Farnia
• Thursday, May 23^rd
  • Hardware-in-the-Loop Test Session Series: SLSC and MathWorks Tools
    • Flexible HIL Design Using NI SLSC by Mikael Bedemo and Roger Johansson
    • HIL and RCP Using MathWorks and NI Tools by Paul Barnard and Jeannie Falcon
  • Automotive Communication Bus Session Series: AUTOSAR and Automotive Ethernet
    • Introducing the New Automotive Ethernet Interface by Aimee Xia
    • AUTOSAR Restbus Simulation by Martin Widder and Andreas Stark
    • AUTOSAR 4.3: Using LabVIEW for a Multiplatform Car Communication Network Framework by Thomas Irmen
  • Best Practices for Data Management and Production Test
    • How Companies Save Millions by Managing Sensor Databy Barry Hutt
    • 2 Ways to Make the Most Out of Your Production Test Systems by Arturo Vargas and Salman Gopalani

Semiconductor Track

• Tuesday, May 21^st
  • Improving the Semiconductor Design to Test Workflow by George Zafiropoulos, VP Solutions Marketing, National Instruments
  • ON Semiconductor Takes a New Approach to Production Test by Warren Latter, Staff Test Engineer, On Semi
• Wednesday, May 22^nd
  • Semiconductor Wafer Probe Test Solutions for mmWave Production by Tim Cleary, Sr. Director of Marketing, FormFactor
  • Challenges and Solutions for mmWave OTA Test by Alejandro Buritica, Senior Product Marketing Manager, National Instruments
  • Key Considerations When Selecting Contactors for 5G and mmWave Semiconductor Devices by John Chung, Manager, Johnstech
• Thursday, May 23^rd
  • Implementing the Latest DPD Models From Theory to Reality by Andy Fenley, Senior Test Engineer, Qorvo
  • How to Succeed (and Fail) at Bridging Validation and Production Test by John Bongaarts, Offering Manager - Semiconductor, National Instruments
  • 400 G Transceiver Test: High-Volume Manufacturing-Ready Solutions by Bill Driver, Senior Product Manager, National Instruments; Ignazio Piacentini, Engineer, Ficontec; Kees Propstra, Sr Director of Product Marketing, multiLane Inc; and Andy Stevens, CEO, Coherent Solutions Ltd