Christopher G. Relf (LabVIEW Champion): Difference between revisions

Latest revision as of 08:42, 22 August 2024

👤 Christopher G. Relf
Citizenship	Farmington Hills, MI
Titles	LabVIEW Champion
Certifications	Certified LabVIEW Architect Certified Professional Instructor
First LabVIEW version	LabVIEW 3.0
Application areas	System Integrator - Medical Aerospace Defense Mining Research and Development Psychometric Vision Systems

Biography:

Christopher G. Relf is the Chief Architect at VI Engineering Inc (a National Instruments Select Alliance Partner), and a freelance technical journalist currently contributing a monthly column in "What's New in Process Technology", published by Westwick-Farrow. A keen software and hardware automation engineer, Christopher is a National Instruments Certified LabVIEW Architect and the author of "Image Acquisition and Processing with LabVIEW" (CRC Press). Christopher's industrial experience includes roles as the Development Manager / Senior Technical Specialist for Neo Vista System Integrators Pty Ltd, an Automation Scientist at the Division of Telecommunications and Industrial Physics of the Australian Commonweath Scientific and Industrial Research Organisation (CSIRO), a Process Software Engineer JDS Uniphase and as a freelance technical journalist for Australian Consolidated Press.

Books:

Discussion Groups:

LAVA, Open-G, NI Discussion Forums

Websites:

Crelf's Technology Article

Articles

"NeoLOG - Datalogging with LabVIEW Plug-ins" - 2005 NI-Week Case Study - Relf C. G.
"Australian Square Kilometer Array Site Testing" - 2005 NI-Week Case Study - Relf C. G., Raynal L.
"Athlete Psychology Testing System" - 2005 NI-Week Case Study - Relf C. G.
"RF Compliance Test System" - 2005 NI-Week Case Study - Relf C. G., Bowyer G. K.
"Wheat Grain Crush Curve Analysis System" - 2003 NI-Week Case Study - Bowyer G. K., Relf C. G.
"Custom System Integration and Commercial Off-The-Shelf Products" - 2005 Information Circular
"TEDS - Are You Ready?" - What's New in Process Technology
"PACs versus PLCs - What are the Real Differences?" - What's New in Process Technology
"Data Validity - Are Your Numbers Legit?" - What's New in Process Technology
"Automated Object Inspection - Finally a Mature Technology" - What's New in Process Technology
"50 Ton Load Cell Testing System" - 2004 NI-Week Case Study - Raynal L., Granger W., Relf C. G.
"Printed Circuit Board (PCB) Automated Inspection System" - 2004 NI-Week Case Study - Relf C. G.
"CAMS - Cable Analysis Measurement System" - 2004 NI-Week Case Study - Relf C. G.
"Rail Line Scan - Overhead Line Alignment Measurement" - 2004 NI-Week Case Study - Relf C. G.
"Laboratory Subject Monitoring and Stimuli Delivery System" - 2004 NI-Week Case Study - Bowyer G. K., Relf C. G.
"Alphachron™ He Extraction/Measurement Instrument" - 2004 NI-Week Case Study - Raynal L., Relf C. G., McInnes B.
"LabVIEW Software Engineering" - 2004 The Engineering Handbook (2nd Ed.)
"Environmental Chamber Monitoring and Control" - 2003 NI-Week Case Study - Granger L., Dick R., Relf C. G.
"LabVIEW Automates Eccentricity Measurement in an Industrial Production Line" - 2002 NI-Week Case Study - Relf C. G.
“Automated Object Inspection – Finally a Mature Technology” - What's New in Process Technology
“Automated Object Inspection – Front-End Components” - What's New in Process Technology
“Automated Object Inspection – Shedding a Little Light on the Subject” - What's New in Process Technology
“Feedback to Better Control your Processes” - What's New in Process Technology
“Closed Loop Control – Common Models” - What's New in Process Technology
“Industrial Automobile Networks – Driving the Data” - What's New in Process Technology
“Deterministic Data Acquisition and Control with a Real-Time Operating System (Part 1)” - What's New in Process Technology
“Deterministic Data Acquisition and Control with a Real-Time Operating System (Part 2)” - What's New in Process Technology

User Groups:

OpenG User Group, LabVIEW Advanced Virtual Architects (LAVA) User Group.

@@ Line 1: / Line 1: @@
-{| class="wikitable"
+{{infobox
-|-
+|category=person
-| '''Name'''
+|name=Christopher G. Relf
-| Christopher G. Relf
+|person-citizenship=Farmington Hills, MI
-|-
+|person-title=champion
-| '''Home'''
+|person-certification=cla
-| Farmington Hills, MI
+|person-certification2=cpi
-|-
+|person-first-labview-version=3.0
-| '''Certification'''
+|person-application-area=System Integrator - Medical
-| Certified LabVIEW Architect, Certified Professional Instructor
+|person-application-area2=Aerospace
-|-
+|person-application-area3=Defense
-| '''Used LabVIEW Since:'''
+|person-application-area4=Mining
-| LabVIEW 3.0
+|person-application-area5=Research and Development
-|-
+|person-application-area6=Psychometric
-| '''Applications Areas'''
+|person-application-area7=Vision Systems
-| System Integrator - Medical, Aerospace, Defense, Mining, Research and Development, Psychometric, Vision Systems
+}}
-|}
-== Biography: ==
-Christopher G. Relf is Test Software and Integration Group Manager at [http://www.viengineering.com VI Engineering Inc], and a freelance technical journalist currently contributing a monthly column in "What's New in Process Technology", published by Westwick-Farrow. A keen software and hardware automation engineer, Christopher is a National Instruments Certified LabVIEW Architect and the author of "Image Acquisition and Processing with LabVIEW" (CRC Press). Christopher's industrial experience includes roles as the Development Manager / Senior Technical Specialist for Neo Vista System Integrators Pty Ltd, an Automation Scientist at the Division of Telecommunications and Industrial Physics of the CSIRO, a Process Software Engineer JDS Uniphase and as a freelance technical journalist for Australian Consolidated Press.
-=== Books: ===
+== Biography:  ==
-*[http://www.amazon.com/exec/obidos/ASIN/0849314801/nationalinstrume Image Acquisition and Processing with LabVIEW (CRC Press)]
-*[http://www.amazon.com/exec/obidos/ASIN/0849315867/nationalinstrume The Engineering Handbook 2nd &3rd Editions (CRC Press)]
-=== Discussion Groups: ===
+Christopher G. Relf is the Chief Architect at [http://www.viengineering.com VI Engineering Inc]&nbsp;(a [http://www.ni.com National Instruments] [http://www.ni.com/alliance/member_levels.htm Select Alliance Partner]), and a freelance technical journalist currently contributing a monthly column in "[http://www.westwick-farrow.com.au/mags/default.asp?origin=process What's New in Process Technology]", published by [http://www.westwick-farrow.com.au Westwick-Farrow]. A keen software and hardware automation engineer, Christopher is a National Instruments [http://sine.ni.com/nips/cds/view/p/lang/en/nid/13477 Certified LabVIEW Architect] and the author of "[http://www.amazon.com/Image-Acquisition-Processing-LabVIEW/dp/0849314801/ref=sr_1_1?ie=UTF8&s=books&qid=1240687027&sr=8-1 Image Acquisition and Processing with LabVIEW]" ([http://crcpress.com/ CRC Press]). Christopher's industrial experience includes roles as the Development Manager / Senior Technical Specialist for [http://www.nvsi.com.au Neo Vista System Integrators Pty Ltd], an Automation Scientist at the Division of Telecommunications and Industrial Physics of the Australian [http://www.csiro.au/ Commonweath Scientific and Industrial Research Organisation] (CSIRO), a Process Software Engineer [http://www.jdsu.com JDS Uniphase] and as a freelance technical journalist for [http://www.acp.com.au/ Australian Consolidated Press].
-Info-LabVIEW, LAVA, Open-G, NI Discussion Forums
+=== Books:  ===
+*[http://www.amazon.com/exec/obidos/ASIN/0849314801/nationalinstrume Image Acquisition and Processing with LabVIEW (CRC Press)]
+*[http://www.amazon.com/exec/obidos/ASIN/0849315867/nationalinstrume The Engineering Handbook 2nd &amp;3rd Editions (CRC Press)]
+=== Discussion Groups:  ===
+LAVA, Open-G, NI Discussion Forums
+=== Websites:  ===
-=== Websites: ===
 *[http://forums.lavag.org/blog/crelfs_technology_articles/index.php? Crelf's Technology Article]
-=== Articles ===
+=== Articles  ===
-#"NeoLOG - Datalogging with LabVIEW Plug-ins" - 2005 NI-Week Case Study - Relf C. G.
-#"Australian Square Kilometer Array Site Testing" - 2005 NI-Week Case Study - Relf C. G., Raynal L.
+#"NeoLOG - Datalogging with LabVIEW Plug-ins" - 2005 NI-Week Case Study - Relf C. G.
-#"Athlete Psychology Testing System" - 2005 NI-Week Case Study - Relf C. G.
+#"Australian Square Kilometer Array Site Testing" - 2005 NI-Week Case Study - Relf C. G., Raynal L.
-#"RF Compliance Test System" - 2005 NI-Week Case Study - Relf C. G., Bowyer G. K.
+#"Athlete Psychology Testing System" - 2005 NI-Week Case Study - Relf C. G.
-#"Wheat Grain Crush Curve Analysis System" - 2003 NI-Week Case Study - Bowyer G. K., Relf C. G.
+#"RF Compliance Test System" - 2005 NI-Week Case Study - Relf C. G., Bowyer G. K.
-#"Custom System Integration and Commercial Off-The-Shelf Products" - 2005 Information Circular
+#"Wheat Grain Crush Curve Analysis System" - 2003 NI-Week Case Study - Bowyer G. K., Relf C. G.
-#"TEDS - Are You Ready?" - What's New in Process Technology
+#"Custom System Integration and Commercial Off-The-Shelf Products" - 2005 Information Circular
-#"PACs versus PLCs - What are the Real Differences?" - What's New in Process Technology
+#"TEDS - Are You Ready?" - What's New in Process Technology
-#"Data Validity - Are Your Numbers Legit?" - What's New in Process Technology
+#"PACs versus PLCs - What are the Real Differences?" - What's New in Process Technology
-#"Automated Object Inspection - Finally a Mature Technology" - What's New in Process Technology
+#"Data Validity - Are Your Numbers Legit?" - What's New in Process Technology
-#"50 Ton Load Cell Testing System" - 2004 NI-Week Case Study - Raynal L., Granger W., Relf C. G.
+#"Automated Object Inspection - Finally a Mature Technology" - What's New in Process Technology
-#"Printed Circuit Board (PCB) Automated Inspection System" - 2004 NI-Week Case Study - Relf C. G.
+#"50 Ton Load Cell Testing System" - 2004 NI-Week Case Study - Raynal L., Granger W., Relf C. G.
-#"CAMS - Cable Analysis Measurement System" - 2004 NI-Week Case Study - Relf C. G.
+#"Printed Circuit Board (PCB) Automated Inspection System" - 2004 NI-Week Case Study - Relf C. G.
-#"Rail Line Scan - Overhead Line Alignment Measurement" - 2004 NI-Week Case Study - Relf C. G.
+#"CAMS - Cable Analysis Measurement System" - 2004 NI-Week Case Study - Relf C. G.
-#"Laboratory Subject Monitoring and Stimuli Delivery System" - 2004 NI-Week Case Study - Bowyer G. K., Relf C. G.
+#"Rail Line Scan - Overhead Line Alignment Measurement" - 2004 NI-Week Case Study - Relf C. G.
-#"Alphachron™ He Extraction/Measurement Instrument" - 2004 NI-Week Case Study - Raynal L., Relf C. G., McInnes B.
+#"Laboratory Subject Monitoring and Stimuli Delivery System" - 2004 NI-Week Case Study - Bowyer G. K., Relf C. G.
-#"LabVIEW Software Engineering" - 2004 The Engineering Handbook (2nd Ed.)
+#"Alphachron™ He Extraction/Measurement Instrument" - 2004 NI-Week Case Study - Raynal L., Relf C. G., McInnes B.
-#"Environmental Chamber Monitoring and Control" - 2003 NI-Week Case Study - Granger L., Dick R., Relf C. G.
+#"LabVIEW Software Engineering" - 2004 The Engineering Handbook (2nd Ed.)
-#"LabVIEW Automates Eccentricity Measurement in an Industrial Production Line" - 2002 NI-Week Case Study - Relf C. G.
+#"Environmental Chamber Monitoring and Control" - 2003 NI-Week Case Study - Granger L., Dick R., Relf C. G.
-#“Automated Object Inspection – Finally a Mature Technology” - What's New in Process Technology
+#"LabVIEW Automates Eccentricity Measurement in an Industrial Production Line" - 2002 NI-Week Case Study - Relf C. G.
-#“Automated Object Inspection – Front-End Components” - What's New in Process Technology
+#“Automated Object Inspection – Finally a Mature Technology” - What's New in Process Technology
-#“Automated Object Inspection – Shedding a Little Light on the Subject” - What's New in Process Technology
+#“Automated Object Inspection – Front-End Components” - What's New in Process Technology
-#“Feedback to Better Control your Processes” - What's New in Process Technology
+#“Automated Object Inspection – Shedding a Little Light on the Subject” - What's New in Process Technology
-#“Closed Loop Control – Common Models” - What's New in Process Technology
+#“Feedback to Better Control your Processes” - What's New in Process Technology
-#“Industrial Automobile Networks – Driving the Data” - What's New in Process Technology
+#“Closed Loop Control – Common Models” - What's New in Process Technology
-#“Deterministic Data Acquisition and Control with a Real-Time Operating System (Part 1)” - What's New in Process Technology
+#“Industrial Automobile Networks – Driving the Data” - What's New in Process Technology
+#“Deterministic Data Acquisition and Control with a Real-Time Operating System (Part 1)” - What's New in Process Technology
 #“Deterministic Data Acquisition and Control with a Real-Time Operating System (Part 2)” - What's New in Process Technology
-=== User Groups: ===
+=== User Groups:  ===
 [[OpenG]] User Group, LabVIEW Advanced Virtual Architects ([[LAVA]]) User Group.
@@ Line 64: / Line 70: @@
 *[[List of LabVIEW Champions]]
 *[[LabVIEW Champions]]
-[[category:LabVIEW Champions|Relf, Christopher G]]