LabVIEW VI Analyzer Toolkit 2017

Tests

Tests included with LabVIEW VI Analyzer Toolkit 2017 by category:

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• Block Diagram
  • Performance
    • Arrays and Strings in Loops
    • Coercion Dots
    • Enabled Debugging
    • In Place Element Structure Usage
    • Inlinable VIs
    • Parallelizable Loops
    • Prepend Scalar With Build Array
    • Redundant Boolean Operations
    • Value Property Usage
    • Wait in While Loop
    • Wired Terminals in Subdiagrams
  • Style
    • Backwards Wires
    • Code Simplification
    • Control Terminal Label Visible
    • Control Terminal Wiring
    • Mixed Terminal Styles
    • Node Density
    • Sequence Structure Usage
    • String Constant Style
    • Tunnel Position
    • Unused Code
    • Wire Bends
    • Wire Crossings
    • Wires Under Objects
  • Warnings
    • Adding Array Size Elements
    • Array Sum and Product Overflow
    • Breakpoint Detection
    • Bundling Duplicate Names
    • Error Cluster Wired
    • For Loop Iteration Count
    • Globals and Locals
    • Hidden Objects in Structures
    • Hidden Tunnels
    • Indexer Datatype
    • Pattern Label
    • Reentrant VI Issues
    • Type Casting References
    • Typedef Cluster Constants
• Complexity Metrics
  • Cyclomatic Complexity
  • Depth of Nesting of Structures
  • Fan In
  • Fan Out
  • Modularity Index
• Documentation
  • Developer
    • Comment Usage
    • Label Call Library Nodes
    • Revision History
  • User
    • Spell Check
    • VI Documentation
• Front Panel
  • SubVI
    • Array Default Values
    • Cluster Sized to Fit
    • Control Alignment
  • User Interface
    • Clipped Text
    • Dialog Controls
    • Duplicate Control Labels
    • Empty List Items
    • Font Usage
    • Overlapping Controls
    • Panel Size and Position
    • Transparent Labels
• General
  • File Properties
    • SubVI and TypeDef Locations
    • VI Extension
    • VI Name
    • VI Saved Version
    • VI Size
  • Icon and Connector Pane
    • Connected Pane Terminals
    • Connector Pane Alignment
    • Connector Pane Pattern
    • Default Icon
    • Error Style
    • Full Connector Pane
    • Icon Size and Border
    • Polymorphic Terminals
    • Terminal Connection Type
    • Terminal Positions
  • VI Properties
    • Broken VI
    • Built Application Compatibility
    • Driver Usage
    • Platform Portability
    • Removed Diagram
    • Toolkit Usage
    • VI Lock State
• VI Metrics
  • Connector Inputs and Outputs
  • Controls and Indicators
  • Diagram Count
  • Diagram Size
  • Node Count
  • Property Reads and Writes
  • Shared Library Calls
  • Structure Count
  • Wire Sources