LabVIEW VI Analyzer Toolkit 2024 Q1
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Tests
Tests included with LabVIEW VI Analyzer Toolkit 2024 Q1 by category:
{"minExpandLevel":1}
- Block Diagram
- Performance
- Style
- Array Constant Style
- Backwards Wires
- Case Structure Default Frame
- Code Simplification
- Control Terminal Label Visible
- Control Terminal Wiring
- Diagram Disable Structures
- Mixed Terminal Styles
- Poor Names of Enum Items
- Sequence Structure Usage
- String Constant Style
- Tunnel Position
- Unused Code
- Wire Bends
- Wire Crossings
- Wires Under Objects
- Warnings
- Adding Array Size Elements
- Array Sum and Product Overflow
- Breakpoint Detection
- Bundling Duplicate Names
- Case Structure with String Range
- Error Cluster Wired
- Find Deprecated Items
- For Loop Error Handling
- For Loop Iteration Count
- For Loop Reference Handling
- Globals and Locals
- Hidden Objects in Structures
- Hidden Tunnels
- Indexer Datatype
- Pattern Label
- Reentrant VI Issues
- Type Casting References
- Unwired I32 Error
- Complexity Metrics
- Documentation
- Front Panel
- General
- File Properties
- Icon and Connector Pane
- VI Properties
- VI Metrics