NI Connect 2023

← NI Connect 2023

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Agenda

Aerospace & Defense

Session	Abstract	Recording
Solving Test Challenges for Satellite Avionics and Power Electronics	Engineering teams building the next generation of satellites must be able to design, test, and integrate them quickly and efficiently to minimize the risk of failure while meeting accelerated market windows. In addition, teams need to satisfy each subsystem’s technical requirements while correlating data across the subsystems to ensure successful integration. In this session, we’ll address the test challenges associated with testing satellite avionics and power electronics subsystems and how to use NI’s leading test capabilities to shorten your time to market.
Characterizing Digital TRMs and ESA Systems	With the move towards electronically scanned array (ESA) technology, the number of electronic components, such as power amplifiers (PAs) and transmit receive modules (TRMs), in a radar system has increased exponentially. For these components, pulsed RF signals save power and provide better range detection. To address the growing demand for pulsed RF measurements on an ESA system, we’re introducing the ESA Characterization Reference Architecture to provide a high-level starting point for characterization and test engineers. In this session, learn how our latest Pulsed RF Measurement Library works with PXI VSTs, SMUs, and other external components to provide pulse RF measurements of power-added efficiency, pulse profile and stability, and S-parameters on digital TRMs.
Validating Satellite Data Links with HIL and SLE	With the growing demand for global satellite communication in commercial business and defense applications, testing and validating satellite components, subsystems, and data links have become increasingly important. However, this process presents many challenges, including the need for accurate simulation and performance data, the complexity of operating scenarios, the dynamism of the satellite channel, and the high cost of testing solutions. Testing satellite communication data links requires a hardware-in-the-loop (HIL) approach. This session will cover how a satellite link emulator (SLE) can address the challenges of data link validation.
Simulation Platform for eVTOL Integrated Test Labs	Archer Aviation specializes in the integration of electric vertical takeoff and landing (eVTOL) vehicles. The laboratory system integration testing of eVTOL vehicles has multiple critical requirements, such as model simulation, signal monitoring, fault injection, real/sim switching, and communication buses. Platform selection is crucial to meet these requirements, and important factors include lead times, cost, and familiarity. NI’s Switch Load and Signal Conditioning (SLSC) integration is critical for Archer’s chosen system design and offers routing and faulting, real/sim switching, VDT simulation, and digital output simulation. In this session, learn how Tech180 Breakout Panels provide physical interfaces to support SLSC integration and how the Distributed Simulation Architecture (DSA) enables a scalable and efficient distributed simulation system.
Rocket Testing: A Case Study in Distributed Control Architectures	Managing distributed, deterministic control systems is essential to many applications, but it’s critical for fire testing a rocket engine during a space launch vehicle. In this session, we’ll use rocket testing as a case study to explore the decisions a system architect must make to build a reliable distributed control and measurement system. We’ll discuss determinism in hardware and software, compare various technologies, and talk to engineers about how they meet these challenges when testing rocket engines.
Covering the Full Radar Test Spectrum: From Digital to Analog and Component to System	Modern radar systems are employing digital technology far and wide to enable agile/dynamic modes of operation that bring new capabilities to operators. Meanwhile, designers seek to expand sensing capabilities to operate in increasingly congested and contested EM battlespaces. In this session, we’ll explore these and other defense radar industry trends and share how NI supports radar system designers across the radar test spectrum: from digital to analog and component to full system. This session includes a live demo of our Radar Target Generation system test capability built on NI’s PXI Vector Signal Transceiver.
Hensoldt's Data Aggregation and Information Mining (DAIM): Manage data and enable data driven decision making in complex maintenance and production environments	This session explores how data aggregation and information mining, or DAIM, can serve as a commercial solution for the data management of current and legacy test systems in aerospace and defense. In addition, learn how DAIM supports data analysis and security throughout the product lifecycle.
Transform Wireless System Design with MathWorks® MATLAB® and NI	Wireless communication, radar systems, and software defined radio (SDR) are highly intricate technologies that require advanced mathematical and computational techniques for their design, simulation, and implementation. Engineers and researchers can use software and hardware tools from MathWorks and NI to facilitate these techniques to enable characterization, design, simulation, and testing and for prototyping real-world systems for over-the-air testing. These tools, based on flexible COTS systems, allow for the development and real-time testing of signals, including 5G and LTE communications, FMCW and pulse radar, multichannel beamforming and direction finding, narrow-band bursty waveforms like Automatic Dependent Surveillance-Broadcast (ADS-B), and even the characterization of power amplifiers used for digital predistortion (DPD). Integrating MathWorks’ mathematical modeling, simulation, code generation, and hardware connectivity capabilities with NI’s instrumentation and SDR expertise ensures engineers can test systems effectively in challenging real-world scenarios. Learn how this combination of proficiency results in a comprehensive and efficient workflow for engineers and researchers across multiple domains, providing a streamlined design and implementation process without the need for extensive knowledge of the underlying hardware.
Multichannel RF Data Recording and Analysis	In systems integration labs (SILs), test chambers, and open-air range testing, multichannel RF recording and monitoring systems acquire, aggregate, and process data to validate electromagnetic systems, including radar, electronic warfare, and data links. Validation engineers and SIL managers must ensure tight synchronization across multiple channels and guarantee that data isn’t dropped. In this session, we’ll introduce a new reference architecture from NI that provides wideband, multichannel RF recording, time synchronization, 100 GbE streaming to disk, and real-time and offline analysis. In addition, we’ll discuss various aspects of system-level RF calibration, including multichannel wideband phase calibration, LO power calibration, and amplitude calibration. We’ll also discuss technology and architecture enabling data movement and storage.
Continuous Integration with LabVIEW and TestStand	In this session, Thales will introduce the concept of continuous integration (CI) in software development and discuss our implementation, including benefits and lessons learned. We’ll also cover the software framework required to implement a CI pipeline and the NI toolset used to automatically conduct static analysis, build trials and execute LabVIEW and TestStand code, and update requirement status. This session includes a working demonstration of the CI pipeline in action and the results dashboard it creates.

Automotive

Session	Abstract	Recording
Modernize and Liberate Your Battery Validation Lab	The challenges of designing and managing a modern EV battery lab are immense and require careful planning and execution to maximize overall operational efficiency. In this session, we’ll go over what you need in terms of hardware, software, resources, and facilities to set up your EV lab for long-term success while avoiding unnecessary disruptions and costs. In addition, you’ll learn how NI can help you plan to run or modernize your battery lab and deliver solutions that help you get to market faster and keep your engineering resources focused on testing to make better batteries.
More Motors? No Problem. Future-Proofing Your Test Systems in an Evolving Electrification Landscape	The traction inverter is the core of an electric vehicle; it’s responsible for maximizing the energy output from the battery to the motor safely, reliably, and as efficiently as possible. The industry is trending towards earlier testing in the development lifecycle, emphasizing hardware-in-the-loop (HIL) testing of the traction inverter ECU. However, as EV technology evolves, test engineers face growing challenges in future-proofing their testbeds for the next generation of EV powertrains. In this session, we’ll discuss trends in EV powertrains, including multimotor powertrains and newer motor types such as electrically excited synchronous machines (EESMs). We’ll also focus on the latest investments made by NI and our partner, OPAL-RT, to keep up with the evolving electrification technology landscape, ensuring engineers can test earlier and more confidently in the traction inverter development lifecycle.
ADAS/AD Workflow Evolution: Advancements in Data-Driven Software Validation	Replacing the human driver promises more productivity, comfort, and safety. However, uneasiness remains as failure risks lives and reputations. This complex challenge requires testing against infinite real-world scenarios that you need to master, where collaboration and a connected workflow are crucial to progress toward the higher levels of vehicle automation the world is expecting. In this session, we’ll focus on the importance of connecting test data and test methodologies through the in-vehicle data record, replay, and hardware-in-the-loop (HIL) test. We’ll also investigate the latest in simulation and direct image injection techniques, plus latency considerations. In this session, Martin Zmrhal and Vit Neruda, tooling managers at Valeo, a top Tier 1 supplier, share how NI’s open, data-driven, and software-connected architecture helps you keep pace with the growing demands of an evolving industry. They’ll present their progress across the different ADAS/AD architectures implemented and explain how reusing skillsets, software, and hardware helps them tackle their current endeavors and prepares them for future challenges, like virtual validation.
No Sensors, No Perception—Let’s Test Them Properly!	Sensors for ADAS and autonomous driving are the eyes and ears to the overall perception of automated vehicles, and they need to be tested thoroughly in validation and manufacturing. In this session, we’ll focus on the latest in production test and investigate two key sensor modalities: radar and camera. You’ll learn how NI and its partners optimize the test feature set to improve sensor bring-up, cycle time, and test throughput while maximizing quality (first pass yield) and minimizing test cost. Plus, you’ll learn about the latest advancements in instrument-level calibration to enhance the precision and accuracy of your test system, leading to better performance of your sensors under test.
What Does Left Shifting Test Mean in the NI Ecosystem?	The last couple of years have brought significant changes and new challenges for the automotive industry. Even before the global pandemic, OEMs and Tier 1 suppliers faced not one but two once-in-a-generation shifts in technology: the introduction of autonomous vehicles and the adoption of electronic drive trains. These shifts continue to accelerate. With short technology cycles for electronics and even shorter cycles for software, our customers are applying new approaches to design, validation, and test, using data and simulation, and investing in toolchains that will scale and adapt to new technology. In this session, we’ll look at the flexible architecture of the xMOVE platform, which customers can reconfigure to meet their needs and stay one step ahead as new exigencies arrive.
Optimizing Manufacturing Test Strategies for the Automotive E/E Architecture Evolution	The unprecedented revolution in the automotive industry demands higher quality standards and reliable products due to new regulations related to autonomous mobility and electric vehicles. Electrical/Electronic (E/E) architectures inside vehicles are evolving to comply with new standards. In addition to increased quality and reliability expectations, test departments must continue to maximize operational efficiency and predictability for high-volume product lines while navigating the supply chain challenges of test system and component suppliers. To overcome these obstacles, your team must devote more time to the product test plan and associated KPIs and less time to the internal workings of the tester. In this session, you’ll learn how best-in-class companies partner with NI to optimize test strategies for quality, reliability, and volume through standardization initiatives based on a flexible test platform.

Semiconductor & Electronics

Session	Abstract	Recording
Enabling the 6G Vision through Test and Measurement	Take a futuristic look at the evolving capabilities of wireless communications standards and how NI’s research labs are investigating test, measurement, and prototyping solutions to enable the deployment of the ICs, software, and systems that will make it happen.
5G Mid-Band, 5G mmWave, or Wi-Fi 7—Which Technology Will Consumers Adopt?	At the onset of 5G, mmWave delivered the fastest speeds for mobile devices. Recently, carriers have also adopted mid-band spectrum to achieve capacity needs, and Wi-Fi 7 brings mmWave-like data rates. This session explores these different standards, the pros and cons of each, and how to prepare for rapidly evolving requirements.
Navigating Wireless Infrastructure Test	Mobile network infrastructures are some of the most complicated systems in the wireless industry. In this session, we’ll discuss test considerations and solutions for wireless infrastructure, from design to validation, production, and maintenance.
Protocol Analyzer for System-Level Digital Communication Validation	Digital communication validation can be challenging to ensure that devices are communicating correctly in a system, especially as newer protocols such as MIPI I3C are on the rise. In this session, we’ll discuss the Soliton Protocol Analyzer, an interactive and easy-to-use protocol analyzer within NI’s InstrumentStudio™ platform.
Empowering PMIC Validation in an Evolving Market	In this session, we’ll discuss how NI’s solutions address the challenges PMIC validation engineers face amid growing demand for energy-efficient devices, vehicle electrification, and more.
Is Parametric Test Technology Keeping Up with Massive Investments and Technology Acceleration in the Semiconductor Foundry Market?	There has been massive investment and technological acceleration in the semiconductor foundry market in recent years. In this session, learn about the latest trends and new test challenges in wafer parametric/reliability testing and how to solve them with massively parallel/scalable parametric test systems.
Will Micro LEDs Revolutionize the Next Generation of TVs, Smartphones, and AR/VR Displays?	What’s preventing micro LED technology from revolutionizing the next-generation display market? Learn about case studies trying to overcome known obstacles.

Test Development & Management

Session	Abstract	Recording
Battery Quality Test, Simplified	By combining the PXI platform with standardized software and purpose-built toolkits, engineers can help ensure the durability of a wide range of products. In this session, test experts will present an NI offering for battery OEM test that helps companies generate reliable, long-lasting devices.
Hardware in the Loop Is for Everyone!	Discover how the hardware-in-the-loop approach across design and test can lower costs and significantly reduce development time while dramatically increasing test coverage across industries.
Practical Implementation of a Standardized Test Architecture	Building a scalable, standardized test architecture to increase engineering efficiency may seem challenging at the onset. Join us for this expert panel discussion for practical advice.
How to Modernize Embedded Software Design, Test, and Validation	Join us for this session to learn how SLB has taken a decisive turn in developing, testing, and validating embedded software in its products thanks to a tripartite collaboration with MathWorks and NI.
Panel: Leading a Successful Engineering Team in a Multigenerational World	Join us for this session to explore how to engage employees, accelerate development, and cover the gap between different working styles and expectations.
Software Validation Best Practice in Regulated Industries	Regulated quality and time to market are traditional adversaries. In this session, we discuss how to accelerate development for medical or aerospace products to win over both sides of this equation.

Connectivity, Data & Insight

Session	Abstract	Recording
Mastering Real-Time Intelligence	Many decisions can’t wait, especially in today’s manufacturing environments. That’s why business responsiveness and automation are critical. Learn how to fail fast to increase throughput, make real-time decisions on a per-unit basis to reduce scrap and rework, and eliminate the need for manual inspection through proven edge computing.
There’s Analytics, and Then There’s the Other 80% to Get There	Data preparation is a critical but often overlooked step in the data analysis and visualization process. Organizations have diverse and dispersed data sources that must be collected, cleaned, transformed, and stored in an accessible and usable format. Although it can be time-consuming and tedious, implementing a strategically designed data pipeline for intended analytics goals can significantly improve the quality and accuracy of those projects. In this session, you’ll learn about the key stages and dependencies that go into an informed data strategy and how early preparation can improve the overall usefulness of the insights gained from future analytics.
What Is OptimalPlus?	NI’s acquisition of OptimalPlus highlighted our intent to help customers get more value from their test and measurement data. The O+ platform is rich in data, analytics, and automation capabilities and has served the semiconductor market for over a decade. In this session, we’ll discuss what makes this platform so unique, how semiconductor companies have benefited from using it, and how other industries can, too, from battery analytics to electronics manufacturing.
Choosing the Right Analytics Approach: Aligning IT Investments with Business Outcomes	Many analytics approaches in the market offer capabilities to manage data, perform analysis, and create insights for various users and business functions. Even at NI, several offerings and approaches exist within this space. In this session, we’ll review NI’s complete lifecycle analytics solution portfolio, which maps our analytics framework to three workstreams: engineering analysis, test operations, and intelligent production. This framework focuses on the benefits you hope to achieve, the problems you’d like to solve, and the data you want to use to identify the right approach. Learn about the various solutions tailored for each workstream and the underlying platform architectures that make those solutions possible.
7 Ways SystemLink™ Software Can Improve Your Test Operations	It can be tough to manage and monitor your fleet of test systems to ensure they’re operating at their peak potential. Learn how SystemLink Enterprise can immediately help improve your test operations at scale. SystemLink can help organizations monitor and manage test systems and track key performance indicators in validation and production environments. In addition, it can quickly diagnose issues to help improve quality and yield and maximize your throughput with our new dashboards and analytics pipeline.
Data, Analytics, and Specification Management with DataStudio	Engineers must analyze large volumes of raw data produced during validation to determine if a product meets specifications. This data may derive from various sources in many different formats and structures. In this session, we’ll share our solution for managing and analyzing validation data through a common data platform. We’ll discuss methods and best practices for data capture and standard logging methodologies. We’ll also explore how raw data can be extracted and stored in a set of standard data models for reusable analytics. Other topics include best practices for integrating analytics with your data, how specifications can be vital to organizing and analyzing your data, and architectural decisions that deliver high performance at enormous data scales.