Template:LabVIEW VI Analyzer Toolkit TreeOfTests

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• Block Diagram
  • Performance
    • Arrays and Strings in Loops
    • Coercion Dots
    • Enabled Debugging
    • In Place Element Structure Usage
    • Inlinable VIs
    • Parallel For Loop Debugging
    • Parallelizable Loops
    • Prepend Scalar With Build Array
    • Redundant Boolean Operations
    • Value Property Usage
    • Wait in While Loop
    • Wired Terminals in Subdiagrams
  • Style
    • Array Constant Style
    • Backwards Wires
    • Case Structure Default Frame
    • Code Simplification
    • Control Terminal Label Visible
    • Control Terminal Wiring
    • Diagram Disable Structures
    • Mixed Terminal Styles
    • Node Density
    • Poor Names of Enum Items
    • Sequence Structure Usage
    • String Constant Style
    • Tunnel Position
    • Unused Code
    • Wire Bends
    • Wire Crossings
    • Wires Under Objects
  • Warnings
    • Adding Array Size Elements
    • Array Sum and Product Overflow
    • Breakpoint Detection
    • Bundling Duplicate Names
    • Case Structure with String Range
    • Error Cluster Wired
    • Find Deprecated Items
    • For Loop Error Handling
    • For Loop Iteration Count
    • For Loop Reference Handling
    • Globals and Locals
    • Hidden Objects in Structures
    • Hidden Tunnels
    • Indexer Datatype
    • Pattern Label
    • Reentrant VI Issues
    • Type Casting References
    • Typedef Cluster Constants
    • Unwired I32 Error
• Complexity Metrics
  • Cyclomatic Complexity
  • Depth of Nesting of Structures
  • Fan In
  • Fan Out
  • Modularity Index
• Documentation
  • Developer
    • Approved Bookmark Tags
    • Comment Usage
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    • Revision History
  • User
    • Spell Check
    • VI Documentation
• Front Panel
  • SubVI
    • Array Default Values
    • Cluster Sized to Fit
    • Control Alignment
  • User Interface
    • Alignment Grid Setting
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• General
  • File Properties
    • SubVI and TypeDef Locations
    • VI Extension
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    • Terminal Connection Type
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  • VI Properties
    • Auto Error Handling Enabled
    • Broken VI
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    • Control VI Type
    • Driver Usage
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    • Separate Compiled Code Setting
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    • VI Lock State
• VI Metrics
  • Connector Inputs and Outputs
  • Controls and Indicators
  • Diagram Count
  • Diagram Size
  • Node Count
  • Property Reads and Writes
  • Shared Library Calls
  • Structure Count
  • Wire Sources

Template documentation

  This documentation is transcluded from Template:LabVIEW VI Analyzer Toolkit TreeOfTests/doc (history).

Displays a tree with tests included in different versions of LabVIEW VI Analyzer Toolkit.

Usage

{{LabVIEW VI Analyzer Toolkit TreeOfTests|version|category|subcategory}}

Parameters

Parameter	Description
version (optional)	The version of LabVIEW VI Analyzer Toolkit to display in the tree. Items not included in the version are omitted.
category (optional)	The category folder to expand when the tree is loaded. Allowed values are any of the top-level folders.
subcategory (optional)	The subcategory folder to expand when the tree is loaded. Allowed values are any of the subfolders.