NI Connect 2024

2024-06-14T13:56:29Z

KevinShirey:

2023-06-11T02:44:56Z

KevinShirey:

{{prevnext|NI Connect 2023|Events|}}

[[File:206300 NI Connect 2023 Austin.png|900px|frameless|center]]

{{TOCright}}
== Links ==
*[https://www.ni.com/en/events/niconnect/austin.html NI Connect Website]
*[https://youtube.com/playlist?list=PLJPcB1f6DiJBXZd5Xlt8q_ee_o3tCUfaE Youtube Playlist]

== Agenda ==
=== Aerospace & Defense ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|Solving Test Challenges for Satellite Avionics and Power Electronics
|Engineering teams building the next generation of satellites must be able to design, test, and integrate them quickly and efficiently to minimize the risk of failure while meeting accelerated market windows. In addition, teams need to satisfy each subsystem’s technical requirements while correlating data across the subsystems to ensure successful integration. In this session, we’ll address the test challenges associated with testing satellite avionics and power electronics subsystems and how to use NI’s leading test capabilities to shorten your time to market.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Characterizing_Digital_TRMs_and_ESA_Systems.pdf Characterizing Digital TRMs and ESA Systems]
|With the move towards electronically scanned array (ESA) technology, the number of electronic components, such as power amplifiers (PAs) and transmit receive modules (TRMs), in a radar system has increased exponentially. For these components, pulsed RF signals save power and provide better range detection.
To address the growing demand for pulsed RF measurements on an ESA system, we’re introducing the ESA Characterization Reference Architecture to provide a high-level starting point for characterization and test engineers. In this session, learn how our latest Pulsed RF Measurement Library works with PXI VSTs, SMUs, and other external components to provide pulse RF measurements of power-added efficiency, pulse profile and stability, and S-parameters on digital TRMs.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Validating_Satellite_Data_Links_with_HIL_and_SLE.pdf Validating Satellite Data Links with HIL and SLE]
|With the growing demand for global satellite communication in commercial business and defense applications, testing and validating satellite components, subsystems, and data links have become increasingly important. However, this process presents many challenges, including the need for accurate simulation and performance data, the complexity of operating scenarios, the dynamism of the satellite channel, and the high cost of testing solutions.
Testing satellite communication data links requires a hardware-in-the-loop (HIL) approach. This session will cover how a satellite link emulator (SLE) can address the challenges of data link validation.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Simulation_Platform_for_eVTOL_Integrated_Test_Labs.pdf Simulation Platform for eVTOL Integrated Test Labs]
|Archer Aviation specializes in the integration of electric vertical takeoff and landing (eVTOL) vehicles. The laboratory system integration testing of eVTOL vehicles has multiple critical requirements, such as model simulation, signal monitoring, fault injection, real/sim switching, and communication buses. Platform selection is crucial to meet these requirements, and important factors include lead times, cost, and familiarity. NI’s Switch Load and Signal Conditioning (SLSC) integration is critical for Archer’s chosen system design and offers routing and faulting, real/sim switching, VDT simulation, and digital output simulation.
In this session, learn how Tech180 Breakout Panels provide physical interfaces to support SLSC integration and how the Distributed Simulation Architecture (DSA) enables a scalable and efficient distributed simulation system.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Rocket_Testing_A_Case_Study_in_Distributed_Control_Architectures.pdf Rocket Testing: A Case Study in Distributed Control Architectures]
|Managing distributed, deterministic control systems is essential to many applications, but it’s critical for fire testing a rocket engine during a space launch vehicle. In this session, we’ll use rocket testing as a case study to explore the decisions a system architect must make to build a reliable distributed control and measurement system. We’ll discuss determinism in hardware and software, compare various technologies, and talk to engineers about how they meet these challenges when testing rocket engines.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Covering_the_Full_Radar_Test_Spectrum_From_Digital_to_Analog_and_Component_to_System.pdf Covering the Full Radar Test Spectrum: From Digital to Analog and Component to System]
|Modern radar systems are employing digital technology far and wide to enable agile/dynamic modes of operation that bring new capabilities to operators. Meanwhile, designers seek to expand sensing capabilities to operate in increasingly congested and contested EM battlespaces. In this session, we’ll explore these and other defense radar industry trends and share how NI supports radar system designers across the radar test spectrum: from digital to analog and component to full system. This session includes a live demo of our Radar Target Generation system test capability built on NI’s PXI Vector Signal Transceiver.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Hensoldts_Data_Aggregation_and_Information_Mining_DAIM_Manage_data_and_enable_data_driven_decision_making_in_complex_maintenance_and_production_environments.pdf Hensoldt's Data Aggregation and Information Mining (DAIM): Manage data and enable data driven decision making in complex maintenance and production environments]
|This session explores how data aggregation and information mining, or DAIM, can serve as a commercial solution for the data management of current and legacy test systems in aerospace and defense. In addition, learn how DAIM supports data analysis and security throughout the product lifecycle.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Transforming_Wireless_System_Design_with_MATLAB_and_NI.pdf Transform Wireless System Design with MathWorks® MATLAB® and NI]
|Wireless communication, radar systems, and software defined radio (SDR) are highly intricate technologies that require advanced mathematical and computational techniques for their design, simulation, and implementation. Engineers and researchers can use software and hardware tools from MathWorks and NI to facilitate these techniques to enable characterization, design, simulation, and testing and for prototyping real-world systems for over-the-air testing. These tools, based on flexible COTS systems, allow for the development and real-time testing of signals, including 5G and LTE communications, FMCW and pulse radar, multichannel beamforming and direction finding, narrow-band bursty waveforms like Automatic Dependent Surveillance-Broadcast (ADS-B), and even the characterization of power amplifiers used for digital predistortion (DPD). Integrating MathWorks’ mathematical modeling, simulation, code generation, and hardware connectivity capabilities with NI’s instrumentation and SDR expertise ensures engineers can test systems effectively in challenging real-world scenarios.
Learn how this combination of proficiency results in a comprehensive and efficient workflow for engineers and researchers across multiple domains, providing a streamlined design and implementation process without the need for extensive knowledge of the underlying hardware.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Optimizing_Validation_Processes_Building%20Complex_Test_Systems_with_Distributed_IO.pdf Optimizing Validation Processes: Building Complex Test Systems with Distributed I/O]
|In this session, learn to improve efficiency and reduce non-recurring engineering costs in validation labs by connecting multiple distributed line-replaceable unit (LRU) test systems. Also learn how to abstract LRUs and construct complex test systems faster and more efficiently using existing distributed I/O and edge computation technology.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Multichannel_RF_Recording_And_Analysis.pdf Multichannel RF Data Recording and Analysis]
|In systems integration labs (SILs), test chambers, and open-air range testing, multichannel RF recording and monitoring systems acquire, aggregate, and process data to validate electromagnetic systems, including radar, electronic warfare, and data links. Validation engineers and SIL managers must ensure tight synchronization across multiple channels and guarantee that data isn’t dropped.
In this session, we’ll introduce a new reference architecture from NI that provides wideband, multichannel RF recording, time synchronization, 100 GbE streaming to disk, and real-time and offline analysis. In addition, we’ll discuss various aspects of system-level RF calibration, including multichannel wideband phase calibration, LO power calibration, and amplitude calibration. We’ll also discuss technology and architecture enabling data movement and storage.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Why_Is_Your_IT_Security_Team_So_Interested_in_Your_Test_System.pdf Why Is Your IT Security Team So Interested in Your Test System?]
|IT teams seem much more interested in test systems than they used to be. Why is that? In this session, we’ll discuss the trends in cybersecurity that are impacting your customers. We’ll also cover some of the requirements coming from government contracts and how they flow down to your company, even if you don’t sell directly to government contracts. Finally, we’ll explore tools and resources for meeting these requirements in a test system.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/aerospace/Continuous_Integration_with_LabVIEW_and_Teststand.pdf Continuous Integration with LabVIEW and TestStand]
|In this session, Thales will introduce the concept of continuous integration (CI) in software development and discuss our implementation, including benefits and lessons learned. We’ll also cover the software framework required to implement a CI pipeline and the NI toolset used to automatically conduct static analysis, build trials and execute LabVIEW and TestStand code, and update requirement status. This session includes a working demonstration of the CI pipeline in action and the results dashboard it creates.
|}
=== Automotive ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|Modernize and Liberate Your Battery Validation Lab
|The challenges of designing and managing a modern EV battery lab are immense and require careful planning and execution to maximize overall operational efficiency.
In this session, we’ll go over what you need in terms of hardware, software, resources, and facilities to set up your EV lab for long-term success while avoiding unnecessary disruptions and costs.
In addition, you’ll learn how NI can help you plan to run or modernize your battery lab and deliver solutions that help you get to market faster and keep your engineering resources focused on testing to make better batteries.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/automotive/More_Motors_No_Problem_Future_Proofing_Your_Test_Systems_in_an_Evolving_Electrification_Landscape.pdf More Motors? No Problem. Future-Proofing Your Test Systems in an Evolving Electrification Landscape]
|The traction inverter is the core of an electric vehicle; it’s responsible for maximizing the energy output from the battery to the motor safely, reliably, and as efficiently as possible. The industry is trending towards earlier testing in the development lifecycle, emphasizing hardware-in-the-loop (HIL) testing of the traction inverter ECU. However, as EV technology evolves, test engineers face growing challenges in future-proofing their testbeds for the next generation of EV powertrains.
In this session, we’ll discuss trends in EV powertrains, including multimotor powertrains and newer motor types such as electrically excited synchronous machines (EESMs). We’ll also focus on the latest investments made by NI and our partner, OPAL-RT, to keep up with the evolving electrification technology landscape, ensuring engineers can test earlier and more confidently in the traction inverter development lifecycle.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/automotive/ADASAD_Workflow_Evolution_Advancements_in_Data_Driven_Validation.pdf ADAS/AD Workflow Evolution: Advancements in Data-Driven Software Validation]
|Replacing the human driver promises more productivity, comfort, and safety. However, uneasiness remains as failure risks lives and reputations. This complex challenge requires testing against infinite real-world scenarios that you need to master, where collaboration and a connected workflow are crucial to progress toward the higher levels of vehicle automation the world is expecting. In this session, we’ll focus on the importance of connecting test data and test methodologies through the in-vehicle data record, replay, and hardware-in-the-loop (HIL) test. We’ll also investigate the latest in simulation and direct image injection techniques, plus latency considerations.
In this session, Martin Zmrhal and Vit Neruda, tooling managers at Valeo, a top Tier 1 supplier, share how NI’s open, data-driven, and software-connected architecture helps you keep pace with the growing demands of an evolving industry. They’ll present their progress across the different ADAS/AD architectures implemented and explain how reusing skillsets, software, and hardware helps them tackle their current endeavors and prepares them for future challenges, like virtual validation.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/automotive/No_Sensors_No_Perception_Lets_Test_Them_Properly.pdf No Sensors, No Perception—Let’s Test Them Properly!]
|Sensors for ADAS and autonomous driving are the eyes and ears to the overall perception of automated vehicles, and they need to be tested thoroughly in validation and manufacturing. In this session, we’ll focus on the latest in production test and investigate two key sensor modalities: radar and camera. You’ll learn how NI and its partners optimize the test feature set to improve sensor bring-up, cycle time, and test throughput while maximizing quality (first pass yield) and minimizing test cost. Plus, you’ll learn about the latest advancements in instrument-level calibration to enhance the precision and accuracy of your test system, leading to better performance of your sensors under test.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/automotive/What_Does_Left_Shifting_Test_Mean_in_the_NI_Ecosystem.pdf What Does Left Shifting Test Mean in the NI Ecosystem?]
|The last couple of years have brought significant changes and new challenges for the automotive industry. Even before the global pandemic, OEMs and Tier 1 suppliers faced not one but two once-in-a-generation shifts in technology: the introduction of autonomous vehicles and the adoption of electronic drive trains. These shifts continue to accelerate.
With short technology cycles for electronics and even shorter cycles for software, our customers are applying new approaches to design, validation, and test, using data and simulation, and investing in toolchains that will scale and adapt to new technology.
In this session, we’ll look at the flexible architecture of the xMOVE platform, which customers can reconfigure to meet their needs and stay one step ahead as new exigencies arrive.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/automotive/Optimizing_Manufacturing_Test_Strategies_for_the_Automotive_EEA_Architecture_Evolution_through_a_Combination_of_Standardization_and_Flexibility.pdf Optimizing Manufacturing Test Strategies for the Automotive E/E Architecture Evolution]
|The unprecedented revolution in the automotive industry demands higher quality standards and reliable products due to new regulations related to autonomous mobility and electric vehicles. Electrical/Electronic (E/E) architectures inside vehicles are evolving to comply with new standards.
In addition to increased quality and reliability expectations, test departments must continue to maximize operational efficiency and predictability for high-volume product lines while navigating the supply chain challenges of test system and component suppliers.
To overcome these obstacles, your team must devote more time to the product test plan and associated KPIs and less time to the internal workings of the tester. In this session, you’ll learn how best-in-class companies partner with NI to optimize test strategies for quality, reliability, and volume through standardization initiatives based on a flexible test platform.
|}
=== Semiconductor & Electronics ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/Enabling_the_6G_Vision_through_Test_and_Measurement.pdf Enabling the 6G Vision through Test and Measurement]
|Take a futuristic look at the evolving capabilities of wireless communications standards and how NI’s research labs are investigating test, measurement, and prototyping solutions to enable the deployment of the ICs, software, and systems that will make it happen.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/5G_midband_%20mmWave_WiFi_7_Which_Technology_Will_Consumers_Adopt.pdf 5G Mid-Band, 5G mmWave, or Wi-Fi 7—Which Technology Will Consumers Adopt?]
|At the onset of 5G, mmWave delivered the fastest speeds for mobile devices. Recently, carriers have also adopted mid-band spectrum to achieve capacity needs, and Wi-Fi 7 brings mmWave-like data rates. This session explores these different standards, the pros and cons of each, and how to prepare for rapidly evolving requirements. 
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/Navigating_Wireless_Infrastructure_Test.pdf Navigating Wireless Infrastructure Test]
|Mobile network infrastructures are some of the most complicated systems in the wireless industry. In this session, we’ll discuss test considerations and solutions for wireless infrastructure, from design to validation, production, and maintenance. 
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/Protocol_Analyzer_for_System_Level_Digital_Communication_Validation.pdf Protocol Analyzer for System-Level Digital Communication Validation]
|Digital communication validation can be challenging to ensure that devices are communicating correctly in a system, especially as newer protocols such as MIPI I3C are on the rise. In this session, we’ll discuss the Soliton Protocol Analyzer, an interactive and easy-to-use protocol analyzer within NI’s InstrumentStudio™ platform.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/Empowering_PMIC_Validation_in_a_Evolving_Market.pdf Empowering PMIC Validation in an Evolving Market]
|In this session, we’ll discuss how NI’s solutions address the challenges PMIC validation engineers face amid growing demand for energy-efficient devices, vehicle electrification, and more.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/Is_Parametric_Test_Technology_Keeping_Up_with_Massive_Investments_and_Technology_Acceleration_in_the_Semiconductor_Foundry_Market.pdf Is Parametric Test Technology Keeping Up with Massive Investments and Technology Acceleration in the Semiconductor Foundry Market?]
|There has been massive investment and technological acceleration in the semiconductor foundry market in recent years. In this session, learn about the latest trends and new test challenges in wafer parametric/reliability testing and how to solve them with massively parallel/scalable parametric test systems.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/semiconductor/Will_Micro_LEDs_Revolutionize_the_Next_Generation_of_TVs_Smartphones_and_ARVR_Displays.pdf Will Micro LEDs Revolutionize the Next Generation of TVs, Smartphones, and AR/VR Displays?]
|What’s preventing micro LED technology from revolutionizing the next-generation display market? Learn about case studies trying to overcome known obstacles.
|}
=== Test Development & Management ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/test/Battery_Quality_Test_Simplified.pdf Battery Quality Test, Simplified]
|By combining the PXI platform with standardized software and purpose-built toolkits, engineers can help ensure the durability of a wide range of products. In this session, test experts will present an NI offering for battery OEM test that helps companies generate reliable, long-lasting devices.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/test/Hardware_in_the_loop_is_for_everyone.pdf Hardware in the Loop Is for Everyone!]
|Discover how the hardware-in-the-loop approach across design and test can lower costs and significantly reduce development time while dramatically increasing test coverage across industries.
|
|-
|Practical Implementation of a Standardized Test Architecture
|Building a scalable, standardized test architecture to increase engineering efficiency may seem challenging at the onset. Join us for this expert panel discussion for practical advice.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/test/How_to_modernize_Embedded_Software_Design_Test_and_Validation.pdf How to Modernize Embedded Software Design, Test, and Validation]
|Join us for this session to learn how SLB has taken a decisive turn in developing, testing, and validating embedded software in its products thanks to a tripartite collaboration with MathWorks and NI.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/test/How_to_modernize_Embedded_Software_Design_Test_and_Validation.pdf How to Modernize Embedded Software Design, Test, and Validation]
|Join us for this session to learn how SLB has taken a decisive turn in developing, testing, and validating embedded software in its products thanks to a tripartite collaboration with MathWorks and NI.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/test/Software_Validation_Best_Practice_in_Regulate_Industries.pdf Software Validation Best Practice in Regulated Industries]
|Regulated quality and time to market are traditional adversaries. In this session, we discuss how to accelerate development for medical or aerospace products to win over both sides of this equation.
|}
=== Connectivity, Data & Insight ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/connectivity/Mastering_Real_Time_Intelligence.pdf Mastering Real-Time Intelligence]
|Many decisions can’t wait, especially in today’s manufacturing environments. That’s why business responsiveness and automation are critical. Learn how to fail fast to increase throughput, make real-time decisions on a per-unit basis to reduce scrap and rework, and eliminate the need for manual inspection through proven edge computing.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/connectivity/Theres_Analytics_and_Then_Theres_the_Other_80_Percent_to_Get_There.pdf There’s Analytics, and Then There’s the Other 80% to Get There]
|Data preparation is a critical but often overlooked step in the data analysis and visualization process. Organizations have diverse and dispersed data sources that must be collected, cleaned, transformed, and stored in an accessible and usable format. Although it can be time-consuming and tedious, implementing a strategically designed data pipeline for intended analytics goals can significantly improve the quality and accuracy of those projects. In this session, you’ll learn about the key stages and dependencies that go into an informed data strategy and how early preparation can improve the overall usefulness of the insights gained from future analytics.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/connectivity/What_is_OptimalPlus.pdf What Is OptimalPlus?]
|NI’s acquisition of OptimalPlus highlighted our intent to help customers get more value from their test and measurement data. The O+ platform is rich in data, analytics, and automation capabilities and has served the semiconductor market for over a decade. In this session, we’ll discuss what makes this platform so unique, how semiconductor companies have benefited from using it, and how other industries can, too, from battery analytics to electronics manufacturing.
|
|-
|Choosing the Right Analytics Approach: Aligning IT Investments with Business Outcomes
|Many analytics approaches in the market offer capabilities to manage data, perform analysis, and create insights for various users and business functions. Even at NI, several offerings and approaches exist within this space. In this session, we’ll review NI’s complete lifecycle analytics solution portfolio, which maps our analytics framework to three workstreams: engineering analysis, test operations, and intelligent production. This framework focuses on the benefits you hope to achieve, the problems you’d like to solve, and the data you want to use to identify the right approach. Learn about the various solutions tailored for each workstream and the underlying platform architectures that make those solutions possible.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/connectivity/7_Ways_Systemlink_Software_Can_Improve_Your_Test_Operations.pdf 7 Ways SystemLink™ Software Can Improve Your Test Operations]
|It can be tough to manage and monitor your fleet of test systems to ensure they’re operating at their peak potential. Learn how SystemLink Enterprise can immediately help improve your test operations at scale. SystemLink can help organizations monitor and manage test systems and track key performance indicators in validation and production environments. In addition, it can quickly diagnose issues to help improve quality and yield and maximize your throughput with our new dashboards and analytics pipeline.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/connectivity/Data_Analytics_and_Specification_Management_with_DataStudio.pdf Data, Analytics, and Specification Management with DataStudio]
|Engineers must analyze large volumes of raw data produced during validation to determine if a product meets specifications. This data may derive from various sources in many different formats and structures. In this session, we’ll share our solution for managing and analyzing validation data through a common data platform. We’ll discuss methods and best practices for data capture and standard logging methodologies. We’ll also explore how raw data can be extracted and stored in a set of standard data models for reusable analytics. Other topics include best practices for integrating analytics with your data, how specifications can be vital to organizing and analyzing your data, and architectural decisions that deliver high performance at enormous data scales.
|}
=== Software & Technology: Programming Essentials ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/Everything_an_Engineer_Needs_to_Know.pdf Everything a Software Engineer Needs to Know That Has Nothing to Do with Software Engineering]
|An engineer’s challenge has two facets: the technical side and the political side. As engineers, we often underestimate the importance of the latter. In this session, we’ll discuss navigating the political front to avoid frustrations and pitfalls.
|
|-
|The LabVIEW UI of Your Dreams
|Often, the LabVIEW front panels we use day after day are far from a “dream UI,” and we’ve all seen some nightmare UIs. In this session, we’ll use a high-minded design philosophy combined with practical developer checklists that you can apply to make your interfaces more functional, consistent, professional, and dreamy.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/Get_the_Most_Out_of_NIs_Package_Management_Capabilities.pdf Get the Most Out of NI’s Package Management Capabilities]
|Learn to maximize NI’s software package management capabilities to modularize, version, and distribute your NI-based software projects and applications.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/Putting_a_Bow_on_Your_Reusable_LabVIEW_Libraries_with_VIPM.pdf Putting a Bow on Your Reusable LabVIEW Libraries with VIPM]
|Trying to turn a handful of LabVIEW libraries into distributable packages can seem like a twisty maze of cross-linking issues and error messages that are mostly alike. We’ll walk through the process of turning a handful of libraries into separate VIPM packages and discuss some of the tripping points.
|
|-
|Panel: Continuous Integration (CI/CD)—Don’t Leave Home without It
|“Continuous Integration” and “CI/CD” are increasingly pervasive buzzwords that keep coming up in many conversations about software engineering. You may be wondering, “Why would I allocate time and resources towards this when we’ve been doing fine without it for decades? What’s in it for me?” In this interactive session, you’ll learn from distinguished industry professionals about the ROI of CI/CD, how to get started, and potential pitfalls. Come ready to pose questions to these experts, who will speak candidly about their experiences with CI/CD and the meaningful impact it can make in software engineering.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/Why_Dataflow_Works_The_Potato_And_Candy_Bar_Explanation.pdf Why Data Flow Works: The Potato and Candy Bar Explanation]
|“LabVIEW is a dataflow programming language.” What does that mean? Why does data flow work as a useful model of computation? Can potatoes defy gravity? How many ways can you eat a candy bar? In this session, we’ll look at the philosophy that underpins LabVIEW to make you more aware of when you’re working with the tool versus working against it.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/HAL_chemy_Turning_Devices_into_Gold.pdf HAL-chemy: Turning Devices into Gold]
|Did you know you can reduce cost and improve engineering efficiency with a properly architected hardware abstraction layer (HAL)? A HAL supports parallel development, combats obsolescence, and increases reuse code. HAL creation should begin with a well-architected design, but problems often arise during a HAL’s lifecycle. For example, what do you do when your hardware goes obsolete? What if different models have different features? How do you manage connections to devices? How should logging, debugging, and error handling be implemented? In this session, we’ll offer solutions to help address these common problems so your HAL and test system can succeed.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/Introduction_To_DQMH.pdf Introduction to DQMH]
|DQMH is the world’s most popular third-party framework for LabVIEW and was designed to facilitate the robust implementation of complex LabVIEW applications while still being accessible to CLAD/CLD-level LabVIEW programmers. In this session, you’ll learn how to use DQMH from an expert.
|
|-
|DQMH and TestStand: From the Validation Bench to the Production Hall
|In this session, we’ll explore how DQMH can be combined with TestStand and a few recommended tools and add-ons from the LabVIEW and TestStand ecosystem to create a toolchain facilitating all facets of product test, from design validation to volume test in a concurrent engineering environment. In addition, we’ll explore instrumentation, measurement, and UUT abstraction and the use of DQMH APIs as TestStand custom step types to streamline the developer experience.
|
|-
|Architecting the Best Test Engineering Team
|The signs are all there: fire-fighting mode, lots of overtime, code that requires heavy maintenance or support, overrunning budget, missed deadlines, lack of documentation, and much more. How would you like to take a vacation and not worry about getting calls from operators trying desperately to get a product out the door? That can happen with the right team structure. Setting up the best team requires appropriately skilled engineers, disciplined processes, and shared standards. In this session, we’ll show you how to assess your team, identify a charter, and achieve the goal of becoming all-stars. If nothing else, come and dream.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/programming/DFD_Design_For_Reality.pdf DFD—Design for Reality]
|Debugging wastes time and gives rise to unrealistic expectations. What if you could create practical systems and software more efficiently instead of demanding perfection from yourself and others? Join us for this session to learn how debugging can be incorporated more effectively during system/software design. We'll explain how this approach compliments TDD, CI, and other techniques and offer practical suggestions you can apply immediately.
|
|-
|G Anywhere: Enhancing LabVIEW Development with a Cross-Platform Embedded Device Library
|Discover a groundbreaking new LabVIEW add-on you can use to create applications for diverse embedded platforms. In this session, you’ll learn how this library streamlines program development and leverages a pure-G compiler to target numerous devices from LabVIEW, such as the Raspberry Pi Pico and other embedded microcontrollers. Explore the future of LabVIEW and how this powerful new add-on will unlock innovation and attract new users.
|[https://youtu.be/7vHngGgZshU YouTube][https://drive.google.com/file/d/1bU6UrkQDaP7-CexOCAdJHVwJXxX5RPzK/view?usp=drive_link Download]
|-}
=== Software & Technology: Products & Technology ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/Whats_New_In_LabVIEW_2023.pdf What's New in LabVIEW 2023]
|Learn about the latest features in LabVIEW 2023 Q1 including enhanced support for calling Python from virtual environments, new tools for finding missing NI drivers and toolkits, availability of more VIPM features for all users, and much more. We will also take a look at the LabVIEW roadmap to see what is coming soon for LabVIEW and the rest of Test Workflow.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/Product_Launch_High_Speed_PXI_FlexRIO_FPGA_Coprocessor.pdf Product Launch: High-Speed PXI FlexRIO FPGA Coprocessor]
|FlexRIO provides a fully reconfigurable instrument that you can program graphically with LabVIEW or VHDL/Verilog. FlexRIO products provide large, user-programmable FPGAs and high-speed analog, digital, and RF I/O. In this session, learn about the newest edition to the FlexRIO family and how you can maximize data movement and computation power.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/5_Best_Practices_for_Maximizing_DC_Measurement_Performance.pdf 5 Best Practices for Maximizing DC Measurement Performance]
|Whatever your DUT is, taking quality DC measurements is a cornerstone of electronics test. In this session, you’ll learn five techniques to achieve greater accuracy in applications requiring DC measurements.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/3_Ways_to_Optimize_Signal_Analysis_with_NI_Oscilliscopes.pdf 3 Ways to Optimize Signal Analysis with NI Oscilloscopes]
|PXI Oscilloscopes are vital instruments that are versatile for both time‐ and frequency‐domain measurements. NI offers a wide range of modular oscilloscopes, which allows you to customize your test station for cost, channel density, measurement resolution, or sampling rate.
In this session, we’ll take a deeper dive into NI oscilloscopes. You’ll learn to optimize the signal analysis with your system’s oscilloscope using NI-TClk synchronization so that multiple instruments can align sample clocks and respond to triggers. You’ll also learn how to avoid testing downtime by verifying the cable integrity of your oscilloscope with CableSense™ technology and how to choose the proper probe to maximize your oscilloscope’s functionality.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/4_Best_Practices_to_Prolong_Relay_Life_in_NI_Switches.pdf 4 Best Practices to Prolong Relay Life in NI Switches]
|Switches are critical components of automated test. They not only route signals to a variety of instruments and devices under test, but they can also be used as a low-cost way to increase the channel count of expensive instrumentation while increasing the flexibility and repeatability of your measurements. In this session, explore the common mistakes engineers make when operating switches and what you can do instead to prevent damage and prolong relay life.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/High_Speed_Syncronization_with_NI_TCIk.pdf High-Speed Synchronization with NI-TClk]
|A key advantage of a PXI system is the integrated timing and synchronization capabilities. Through shared timing and synchronization, you can vastly improve the accuracy of measurements, apply advanced triggering schemes, or synchronize multiple devices to act as one for extremely high-channel-count applications. NI has developed a patented method for synchronization whereby another signal-clock domain is used to enable alignment of sample clocks and the distribution and reception of triggers, called NI-TClk. In this session, learn the best practices for using NI-TClk to synchronize high-speed signal acquisition and generation between devices in one or more chassis.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/How_to_Build_a_MeasurementLink_Plug_in.pdf How to Build a MeasurementLink™ Plug-In]
|A key challenge for engineering organizations is how to create and maintain test frameworks over time that meet the evolving needs of their company while delivering efficient workflows for test professionals. Test environments get more complicated, software languages evolve, new instrumentation is created, and the maintenance cost of test solutions increases.
MeasurementLink is a solution that establishes a connected workflow for test professionals that spans interactive and automated measurements. It allows test developers to create reusable measurements written in multiple software languages, using instruments from multiple vendors, and focus more on the measurement logic than the infrastructural components of a test framework. The MeasurementLink design is service-based and interface-centric, which allows existing test infrastructure to take advantage of new measurement capabilities and allows measurements written today to become increasingly capable over time.
In this session, learn how to build a MeasurementLink plug-in from scratch, create a language-agnostic UI using the MeasurementLink UI Editor, and safely access both NI and non-NI hardware across multiple processes.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/Using_Python_and_TestStand_to_Boost_Your_Test_Development.pdf Using Python and TestStand to Boost Your Test Development]
|Discover the latest in the TestStand Python Adapter: seamless debugging and module reloading, support for namespaces, and advanced access to inner classes and methods using Python’s Jedi package.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/How_to_get_the_most_out_of_PXI_VSTs.pdf How to Get the Most Out of PXI VSTs]
|PXI VSTs are highly versatile, technically capable instruments that enable multiple RF test applications. They’re unique in RF test (different from box instrumentation) and are most beneficial if you leverage their strengths. The PXIe-5842 VST includes new features for better measurement performance and new capabilities that weren’t possible with a VST until now.
This session will focus on maximizing your PXI VST and taking common measurements like EVM, ACP, harmonics, and noise figure. In addition, we’ll suggest best practices for leveraging a common platform and taking advantage of the strengths of software-defined RF test.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/5_Tips_for_Optimizing_NI_SMUs_for_High_Throughput_Test.pdf 5 Tips for Optimizing NI SMUs for High-Throughput Test]
|Source measure units (SMUs) are used frequently in production test for low-noise, high-accuracy measurements. However, many of these measurements are unnecessarily throttled because of software overhead, long settling times, or inefficient use of the instrument’s measurement engine. NI SMUs combine the power and measurement performance of traditional box SMUs with NI technology that makes them smaller, faster, and more flexible. In this session, discover how to optimize SMUs for test throughput while maintaining an acceptable level of precision through techniques such as optimizing aperture time, making the best use of programming API features, and using NI SourceAdapt technology.
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/USRP_X440_Game_Changing_Bandwidth_and_Channel_Density_in_SDR.pdf USRP X440—Game-Changing Bandwidth and Channel Density in SDR]
|The new NI Ettus USRP X440 is the first USRP to use a direct sampling architecture, with wide bandwidths, more channels, and phase coherence across multiple channels. It’s ideal for research, prototyping, and deployment in satellite communications, radar, beamforming, and direction-finding applications. This session will discuss how the X440 differs from other USRP devices and provide information on maximizing its use, including Nyquist zone considerations, selecting accompanying front ends and converter rates, and software/hardware options for connectivity and data transfer. The session will also explore using the USRP X440 for phase-coherent, multichannel applications and for capturing wideband signals. 
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/product/What_happens_when_you_build_test_systems_on_Linux.pdf What Happens When You Build Test Systems on Desktop Linux?]
|Many NI customers and partners are weighing the pros and cons of migrating to Linux and trying to understand if it’s ready for their development workflows or deployed systems. Answering these questions can be complex. In this session, hear from several NI customers about their deployed or prototyped systems built on desktop Linux distributions (such as RHEL, Ubuntu, and OpenSUSE), the benefits that pushed them to a Linux solution, and the obstacles that they overcame to enable their migration or new system designs on Linux. 
|}
=== Software & Technology: Software Hands-On ===
{| class="wikitable"
|-
!Session
!Abstract
!Recording
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/software/Software_Hands_On_Test_Drive_SystemLink_to_Learn_to_Maximize_Your_Test_Operations.pdf Test Drive SystemLink to Learn to Maximize Your Test Operations]
|In this hands-on session, walk through a SystemLink workflow and learn how to connect test systems, view collected data, set up a dashboard, and more.  
|
|-
|[https://www.ni.com/content/dam/web/pdfs/niconnect/2023/software/Software_Hands_On_Leverage_Interoperability_between_NIs_Software_to_Drive_Standardization_across_Workflows.pdf Leverage Interoperability between NI’s Software to Drive Standardization across Workflows]
|In this hands-on session, you’ll learn how to extend InstrumentStudio, LabVIEW, TestStand, and other NI software. We’ll cover topics such as measurement bring-up, debugging scripts with InstrumentStudio, automation in TestStand, incorporating Python into your workflow, and more. Join us to learn more about connecting NI’s software to drive standardization and reuse across your workflows.
|}

[[Category:NI Connect]]